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371 résultats

   40 Revues internationales
    4 Brevets
   30 Conférences invitées
  157 Conférences internationales
   15 Chapitres de livre
   12 Livres & Ouvrages
    1 Revues nationales
   37 Conférences nationales
   20 Autres communications
   25 Rapports
   30 Thèses

40 Revues internationales

 1 Leger G., Barragan M., Brownian distance correlation-directed search: A fast feature selection technique for alternate test, Integration, the VLSI Journal, Ed. Elsevier, Vol. , 2016
 
 2 Barragan M., Stratigopoulos H., Mir S., Le-Gall H., Bhargava N., Bal A., Practical Simulation Flow for Evaluating Analog and Mixed-Signal Test Techniques, IEEE Design & Test, Ed. IEEE, Vol. 33, No. 6, pp. 46-54, DOI: 10.1109/MDAT.2016.2590985, décembre 2016
 
 3 Barragan M., Alhakim R., Stratigopoulos H., Dubois M., Mir S., Le-Gall H., Bhargava N., Bal A., A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio Sigma-Delta ADC, IEEE Transactions on Circuits and Systems, Ed. IEEE, Vol. 63, No. 11, pp. 1876-1888, DOI: 10.1109/TCSI.2016.2602387, novembre 2016
 
 4 Renaud G., Barragan M., Laraba A., Stratigopoulos H., Mir S., Le-Gall H., Naudet H., A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 32, No. 4, pp. 407-421, DOI: 10.1007/s10836-016-5599-8, avril 2016
 
 5 Laraba A., Stratigopoulos H., Mir S., Naudet H., Exploiting pipeline ADC properties for a reduced-code linearity test technique, IEEE Transactions on Circuits and Systems, Ed. IEEE, Vol. 62, No. 10, pp. 2391-2400, DOI: 10.1109/TCSI.2015.2469014, octobre 2015
 
 6 Dimakos A., Stratigopoulos H., Siligaris A., Mir S., De Foucauld E., Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 31, No. 4, pp. 381-394, DOI: 10.1007/s10836-015-5534-4, août 2015
 
 7 Barragan M., Leger G., A Procedure for Alternate Test Feature Design and Selection , IEEE Design and Test of Computers, Ed. IEEE, Vol. 32, No. 1, pp. 18-25, DOI: 10.1109/MDAT.2014.2361722, février 2015
 
 8 Beznia K., Bounceur A., Euler R., Mir S., A tool for analog/RF BIST evaluation using statistical models of circuit parameters, Transactions on Design Automation of Electronic Systems (TODAES), Ed. ACM, NY, USA, Vol. 20 , No. 2, DOI: 10.1145/2699837, février 2015
 
 9 Barragan M., Leger G., Vazquez D., Rueda A., On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications, Analog Integrated Circuits and Signal Processing, Ed. Kluwer Academic Publishers, Vol. 82, No. 1, pp. 67-79, DOI: 10.1007/s10470-014-0456-0, janvier 2015
 
10 Stratigopoulos H., Sunter S., Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics , IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. 33, No. 12, pp. 1977 - 1990 , DOI: 10.1109/TCAD.2014.2360458, décembre 2014
 
11 Alhakim R., Raoof K., Simeu E., Design of tracking loop with dirty templates for UWB communication systems, Signal Image and Video Processing Journal, Ed. Springer , Vol. 8, No. 3, pp. 461-477, DOI: 10.1007/s11760-012-0352-y, mars 2014
 
12 Alhakim R., Raoof K., Simeu E., Detection of UWB signal using dirty template approach, Signal Image and Video Processing Journal, Ed. Springer , Vol. 8, No. 3, pp. 549-563, DOI: 10.1007/s11760-013-0554-y, mars 2014
 
13 Laraba A., Stratigopoulos H., Mir S., Naudet H., Bret G., Reduced code linearity testing of pipeline ADCs, IEEE Design and Test of Computers, Ed. IEEE, Vol. 30, No. 6, pp. 80-88, DOI: 10.1109/MDAT.2013.2267957, décembre 2013
 
14 Alhakim R., Simeu E., Raoof K., Novel control for delay-locked loop in IR-UWB communication systems, Control Engineering Practice, Ed. IFAC - International Federation of Automatic Control, Vol. 21, No. 10, pp. 1437-1454, DOI: 10.1016/j.conengprac.2013.06.014, octobre 2013
 
15 Alhakim R., Raoof K., Simeu E., Serrestou Y., Cramer-Rao lower bounds and maximum likelihood timing synchronization for dirty template UWB communications , Signal Image and Video Processing Journal, Ed. Springer , Vol. 7, July, No. 4, pp. 741-757, DOI: 10.1007/s11760-011-0265-1, juillet 2013
 
16 Huang K., Stratigopoulos H., Mir S., Hora C., Xing Y., Kruseman B., Diagnosis of Local Spot Defects in Analog Circuits , IEEE Transactions on Instrumentation and Measurement, Ed. IEEE, Vol. 61, No. 10, pp. 2701 - 2712 , DOI: 10.1109/TIM.2012.2196390, octobre 2012
 
17 Stratigopoulos H., Mir S., Adaptive Alternate Analog Test, IEEE Design and Test of Computers, Ed. IEEE, Vol. 29, No. 4, pp. 71-79, DOI: 10.1109/MDT.2012.2205480, juillet-août 2012
 
18 Kamsu-Foguem B., Simeu E., Optimizing Construction of Scheduled Data Flow Graph for Online testability, The Mediterranean Journal of Computers and Networks , Vol. 8, No. 4, pp. 125-133, janvier 2012
 
19 Stratigopoulos H., Test Metrics Model for Analog Test Development, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. 31, No. 7, pp. 1116 - 1128 , DOI: 10.1109/TCAD.2012.2185931, janvier 2012
 
20 Abdallah L., Stratigopoulos H., Mir S., Kelma C., RF Front-End Test Using Built-in Sensors , IEEE Design and Test of Computers, Ed. IEEE, Vol. 28, No. 6, pp. 76-84, DOI: 10.1109/MDT.2011.131 , novembre-décembre 2011
 
21 Bounceur A., Mir S., Stratigopoulos H., Estimation of Analog Parametric Test Metrics Using Copulas, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. 30, No. 9, pp. 1400-1410, DOI: 10.1109/TCAD.2011.2149522 , septembre 2011
 
22 Bousquet L., Cenni F., Simeu E., Inclusion of Power Consumption Information in High-Level Modeling of Linear Analog Blocks , Journal of Low Power Electronics (JOLPE), Ed. American Scientific Publishers, Vol. 7, No. 4, pp. 541-551, DOI: http://dx.doi.org/10.1166/jolpe.2011.1156, janvier 2011
 
23 Cenni F., Cazalbou J., Mir S., Rufer L., Design of a SAW-based chemical sensor with its microelectronics front-end interface , Microelectronics journal, Ed. Elsevier, Vol. 41, No. 11, pp. 723-732, DOI: 10.1016/j.mejo.2010.06.008 , novembre 2010
 
24 Stratigopoulos H., Drineas P., Slamani M., Makris Y., RF Specification Test Compaction Using Learning Machines, Transactions on Very Large Scale Integration (VLSI) Systems, Ed. IEEE, Vol. 18, No. 6, pp. 998 - 1002 , DOI: 10.1109/TVLSI.2009.2017196 , janvier 2010
 
25 Tounsi F., Mezghani B., Rufer L., Masmoudi M., Mir S., Electromagnetic Investigation of a CMOS MEMS Inductive Microphone, Sensors & Transducers Journal (ISSN 1726- 5479), Ed. IFSA, International Frequency Sensor Association, Vol. 108, No. 9, pp. 40-53, septembre 2009
 
26 Dhayni A., Mir S., Rufer L., Bounceur A., Simeu E., Pseudorandom BIST for test and characterization of linear and nonlinear MEMS, Microelectronics journal, Ed. Elsevier, Vol. 40, No. 7, pp. 1054-1061, DOI: 10.1016/j.mejo.2008.05.012, juillet 2009
 
27 Stratigopoulos H., Mir S., Bounceur A., Evaluation of analog/RF test measurements at the design stage, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. 28, No. 4, pp. 582-590, DOI: 10.1109/TCAD.2009.2016136, avril 2009
 
28 Lalinsky T., Ryger I., Rufer L., Vanko G., Hascik S., Mozolova Z., Tomaska M., Vincze A., Surface Acoustic Wave Excitation on SF6 plasma treated AlGaN/GaN heterostructure, Vacuum Journal , Ed. Elsevier, Vol. 84, No. 1, pp. 231-234 , DOI: 10.1016/j.vacuum.2009.05.010, janvier 2009
 
29 Stratigopoulos H., Makris Y., Error moderation in low-cost machine-learning-based analog/RF testing, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. 27(2), pp. 339-351, DOI: 10.1109/TCAD.2007.907232 , 2008
 
30 Lalinsky T., Rufer L., Vanko G., Mir S., Hascik S., Mozolova Z., Vincze A., Uherek F., AlGaN/GaN heterostructure based surface acoustic wave structures for chemical sensors, Applied Surface Science, Ed. Elsevier, Vol. 255, No. 3, pp. 712-714, DOI: 10.1016/j.apsusc.2008.07.016 , novembre 2008
 
31 Simeu E., Nguyen H.N., Cauvet P., Mir S., Rufer L., Khereddine R., Using signal envelope detection for online and offline RF MEMS switch testing, Journal of VLSI Design, Ed. Hindawi Publishing Corporation, Vol. 2008, No. Article ID 294014, pp. 1-10, DOI: 10.1155/2008/294014, janvier 2008
 
32 Bounceur A., Mir S., Simeu E., Rolindez L., Estimation of test metrics for the optimisation of analogue circuit testing, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 23, No. 6, pp. 471-484, DOI: 10.1007/s10836-007-5006-6, juin 2007
 
33 Ma W., Zhu R., Rufer L., Zohar Y., Wong M., An integrated floating-electrode electric micro-generator, Journal of Microelectromechanical Systems, Ed. IEEE, Vol. 16, No. 1, pp. 29-37, DOI: 10.1109/JMEMS.2006.885856, janvier 2007
 
34 Rolindez L., Mir S., Bounceur A., Carbonero J.L., A BIST scheme for SNDR testing of sigma delta ADCs using sine-wave fitting, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 22, No. 4-6, pp. 325-335, DOI: 10.1007/s10836-006-9500-z, décembre 2006
 
35 Rufer L., Domingues C., Mir S., Petrini V., Jeannot J.C., Delobelle P., A CMOS compatible ultrasonic transducer fabricated with deep reactive ion etching, Journal of Microelectromechanical Systems, Ed. IEEE, Vol. 15, No. 6, pp. 1766-1776, DOI: 10.1109/JMEMS.2006.886390, décembre 2006
 
36 Mir S., Rufer L., Dhayni A., Built-in-self-test techniques for MEMS, Microelectronics journal, Ed. Elsevier, Vol. 37, No. 12, pp. 1591-1597 , DOI: 10.1016/j.mejo.2006.04.016, décembre 2006
 
37 Alam M.O., Wu B.Y., Chan Y.C., Rufer L., Reliability of BGA Solder Joints on the Au/Ni/Cu Bond Pad – Effect of Thicknesses of Au and Ni layer, IEEE Transactions on Device and Materials Reliability, Vol. 6, No. 3, pp. 421-428, DOI: 10.1109/TDMR.2006.881451, janvier 2006
 
38 Prenat G., Mir S., Rolindez L., Vazquez D., A low-cost digital frequency testing approach for mixed-signal devices using Sigma Delta modulation, Microelectronics journal, Ed. Elsevier, Vol. 36, No. 12, pp. 1080-1090, DOI: 10.1016/j.mejo.2005.04.062, décembre 2005
 
39 Rufer L., Mir S., Simeu E., Domingues C., On-chip pseudorandom MEMS testing, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 21, No. 3, pp. 233-241, DOI: 10.1007/s10836-005-6353-9, juin 2005
 
40 Roman C., Mir S., Charlot B., Building an analogue fault simulation tool and its application to MEMS, Microelectronics journal, Ed. Elsevier, Vol. 34, No. 10, pp. 897-906, DOI: 10.1016/S0026-2692(03)00162-9, octobre 2003
 
remonter

4 Brevets

1 Mir S., Circuit and method for on-chip testing of a pixel array, No. 14/60121, 21 octobre 2014
 
2 Dubois M., Mir S., Stratigopoulos H., Sigma-Delta ADC with test circuit, No. 10/02741 , 1 juin 2010
 
3 Rehder G.P., Ligne de transmission haute fréquence accordable, No. Demande de brevet No 10/52067, 23 mars 2010
 
4 Simeu E., Bortolin-Argenton E., Procédé de détection de défaillance d'un capteur analogique et dispositif de détection pour mettre en œuvre le dit procédé, No. 08/03.420, 19 juin 2008
 
remonter

30 Conférences invitées

 1 Mir S., Fei R., Moreau J., Droniou T., BIST of power and control lines in CMOS imagers, Invited talk (Special Session), 21st IEEE International Mixed-Signal Testing Workshop (IMSTW'16), Sant Feliu de Guixols, SPAIN, 4 au 6 juillet 2016
 
 2 Barragan M., Leger G., Efficient strategies for feature selection and discovery in machine-learning test applications, Invited talk (Special Session), Conference on Design of Circuits and Integrated Systems (DCIS'15), Estoril, PORTUGAL, 25 au 27 novembre 2015
 
 3 Dimakos A., Andraud M., Abdallah L., Stratigopoulos H., Simeu E., Mir S., Test and calibration of RF circuits using built-in non-intrusive sensors, Invited talk (Special Session), IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15), Montpellier, FRANCE, 8 au 10 juillet 2015
 
 4 Mir S., Analog, mixed-signal and MEMS design-for-test and its use for WSN, Invited Tutorial, Winter School on Wireless Sensor Networks (WSWSN), Algiers, ALGERIA, 14 au 15 décembre 2014
 
 5 Altet J., Aldrete-Vidrio E., Reverter F., Gomez D., Gonzalez J.L., Onabajo M., Silva-Martinez J., Martineau B., Perpinà X., Abdallah L., Stratigopoulos H., Aragonès X., Jordà X., Vellvehi M., Dilhaire S., Mir S., Mateo D., Review of temperature sensors as monitors for RF mmW built-in testing and self-calibration schemes, Invited Talk, 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), pp. 1081-1084, Texas, UNITED STATES, DOI: 10.1109/MWSCAS.2014.6908606, 3 au 6 août 2014
 
 6 Mir S., Analog/RF test techniques, Invited Tutorial, 14th European Test Symposium, Test Spring School, Paderborn, GERMANY, 26 au 30 mai 2014
 
 7 Dubois M., Stratigopoulos H., Barragan M., Alhakim R., Mir S., Analog/RF test problem solving with statistically sampled data, Invited talk (Elevator talk), IEEE VLSI Test Symposium (VTS'14), Napa, California, UNITED STATES, 14 au 16 mai 2014
 
 8 Stratigopoulos H., RF Built-In Test with Non-Intrusive Sensors, IEEE VLSI Test Symposium (VTS'14), Napa, California, UNITED STATES, 13 au 17 avril 2014
 
 9 Mir S., Statistical learning for test and control of analog/RF circuits, Keynote talk, 4th European Workshop on CMOS Variability (VARI'13), Karlsruhe, GERMANY, 9 au 11 septembre 2013
 
10 Abdallah L., Stratigopoulos H., Mir S., Implicit Test of High-Speed Analog Circuits Using Non-Intrusive Sensors, Invited talk (Special Session), IEEE European Conference on Circuit Theory and Design (ECCTD’11), Linköping, SWEDEN, 29 au 31 août 2011
 
11 Stratigopoulos H., Statistical Learning for Analog Circuit Testing, Conference on International Design & Technology of Integrated Systems in Nanoscale Era (DTIS’11), Athens, GREECE, 6 au 8 avril 2011
 
12 Stratigopoulos H., Mir S., Adaptive Alternate Analog Test, Invited talk (Special Session), IEEE Latin-American Test Workshop (LATW’11), Porto de Galinhas, BRAZIL, 27 au 30 mars 2011
 
13 Mir S., Stratigopoulos H., Dubois M., Bounceur A., Evaluation of parametric test metrics for mixed-signal/RF DFT solutions using statistical techniques, Invited Talk, Catrene European Nanoelectronics Design Technology Conference, Grenoble, FRANCE, 23 au 24 juin 2010
 
14 Mir S., Stratigopoulos H., Bounceur A., Density estimation for analog/RF test problem solving, Invited Talk, 28th IEEE VLSI Test Symposium, pp. 41, Santa Cruz, UNITED STATES, DOI: 10.1109/VTS.2010.5469620 , 19 au 22 avril 2010
 
15 Simeu E., Embedded Test and Control of Analogue/RF Circuits Using Intelligent Resources, Embedded tutorial, 11th Latin America Test Workshop (LATW'10), Punta del Este, URUGUAY, 28 au 31 mars 2010
 
16 Stratigopoulos H., Checkers for on-line monitoring of analog circuits, Emerging Technologies Workshop (ETW'09), Vancouver, CANADA, 23 au 25 septembre 2009
 
17 Courtois B., Charlot B., Di Pendina G., Rufer L., Infrastructures for education, research and industry: CMOS and MEMS for BioMed, 12th World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI’08), Orlando, FL, UNITED STATES, 29 juin au 2 juillet 2008
 
18 Mir S., Evaluation of mixed-signal/RF DFT solutions for SiP devices using statistical techniques, Invited Talk, Workshop on Reliability & DfX engineering for System-in-Package Technologies (SiPeX'08), Pallanza, ITALY, 29 mai 2008
 
19 Mir S., Rufer L., Simeu E., Nguyen H.N., Khereddine R., DFT for MEMS, Invited Talk, RF-MEMS Workshop on Industry Applications: RF power MEMS: reliability and applications, Barcelona, SPAIN, 28 juin 2007
 
20 Mir S., Test intégré des circuits mixtes, Invited Talk, Journées de la section électronique du Club EEA, SiP et SoC : nouvelles perspectives, nouveaux défis, Montpellier, FRANCE, 27 mars 2007
 
21 Simeu E., Mir S., Rufer L., Concurrent testing embedded systems: adapting automatic control techniques to microelectronics testing , Invited Talk, 16th IFAC World Congress, pp. Paper Tu-A15-TO, Prague, CZECH REPUBLIC, 4 au 8 juillet 2005
 
22 Simeu E., Mir S., Rufer L., Online testing embedded systems: adapting automatic control techniques to microelectronics testing, Invited Talk, 16th IFAC World Congress, pp. 1180-1180, Prague, CZECH REPUBLIC, DOI: 10.3182/20050703-6-CZ-1902.01181, 1 juillet 2005
 
23 Mir S., Rufer L., Dhayni A., Built-In Self-Test techniques for MEMS, Invited Talk, 1st International Workshop on Advances in Sensors and Interfaces (IWASI'05), pp. 34-38, Bari, ITALY, 19 au 20 avril 2005
 
24 Mir S., Rufer L., Charlot B., Courtois B., On-chip testing of embedded silicon transducers, Plenary talk, The 16th International Conference on Microelectronics (ICM'04), pp. 1-7, Iowa, UNITED STATES, DOI: 10.1109/ICM.2004.1434190, 6 au 8 décembre 2004
 
25 Mir S., Charlot B., Rufer L., Courtois B., On-chip testing of embedded silicon transducers, Invited Talk, IEEE International SOC Conference (SOCC'04), pp. 13-18, Santa Clara, CA, UNITED STATES, DOI: 10.1109/SOCC.2004.1362334, 12 au 15 septembre 2004
 
26 Mir S., Prenat G., Rolindez L., Simeu E., Rufer L., On-chip analogue testing based on ΣΔ modulation, Invited Talk, Workshop on the testing of high resolution mixed signal interfaces, Ajaccio, Corse, FRANCE, 1 mai 2004
 
27 Mir S., Rufer L., Courtois B., On-chip testing of embedded transducers, Invited Talk, 17th International Conference on VLSI Design, pp. 463-472, Mumbai, INDIA, DOI: 10.1109/ICVD.2004.1260965, 5 au 9 janvier 2004
 
28 Mir S., Integrated circuit testing: from microelectronics to microsystems, Plenary talk, 5th IFAC Symposium on Fault Detection, Supervision and Safety of Technical Processes (SAFEPROCESS'03), Washington, D.C, UNITED STATES, 9 au 11 juin 2003
 
29 Mir S., Rolindez L., Domingues C., Rufer L., An implementation of memory-based on-chip analogue test signal generation, Invited Talk, Asia and South Pacific Design Automation Conference (ASP-DAC'03) , pp. 663-668, Kitakyushu, JAPAN, 21 au 24 janvier 2003
 
30 Charlot B., Mir S., MEMS testing, Invited Talk, International Summer School on Advanced Microelectronics (MIGAS), Autrans, FRANCE, 23 au 29 juin 2002
 
remonter

157 Conférences internationales

  1 Gines A., Peralias E., Leger G., Rueda A., Renaud G., Barragan M., Mir S., Design Trade-offs for On-chip Driving of High-speed High-performance ADCs in Static BIST Applications, IEEE 21st International Mixed-Signal Testing Workshop (IMSTW'16), Sant Feliu de Guixols, SPAIN, 4 au 7 juillet 2016
 
  2 Malloug H., Barragan M., Mir S., Le-Gall H., Mostly-digital design of sinusoidal signal generators for mixed-signal BIST applications using harmonic cancellation, IEEE 21st International Mixed-Signal Testing Workshop (IMSTW'16), Sant Feliu de Guixols, SPAIN, 4 au 7 juillet 2016
 
  3 Portolan M., Barragan M., Malloug H., Mir S., Interactive Mixed-Signal Testing Through 1687, First International Test Standards Application Workshop (TESTA'16), Amsterdam, NETHERLANDS, 26 au 27 mai 2016
 
  4 Gines A., Peralias E., Leger G., Rueda A., Renaud G., Barragan M., Mir S., Linearity Test of High-speed High-performance ADCs using a Self-Testable On-chip Generator, 21st IEEE European Test Symposium (ETS'16), Amsterdam, NETHERLANDS, 23 au 27 mai 2016
 
  5 Leger G., Barragan M., Questioning the reliability of Monte Carlo simulation for machine learning test validation, 21st IEEE European Test Symposium (ETS'16), Amsterdam, NETHERLANDS, 23 au 27 mai 2016
 
  6 Dimakos A., Stratigopoulos H., Siligaris A., Mir S., De Foucauld E., Built-in test of millimeter-wave circuits based on non-intrusive sensors, Design, Automation and Test in Europe Conference (DATE'16), pp. 505-510, Munich, GERMANY, 14 au 18 mars 2016
 
  7 Pastorelli C., Mellot P., Mir S., Tubert C., ADC techniques for optimized conversion time in CMOS image sensors, IS&T International Symposium on Electronic Imaging, Image Sensors and Imaging Systems, pp. 268.1-268.6, San Francisco, CA, UNITED STATES, 14 au 18 février 2016
 
  8 Stratigopoulos H., Barragan M., Mir S., Le-Gall H., Bhargava N., Bal A., Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times, IEEE International Test Conference (ITC'15), Anaheim, CA, UNITED STATES, 6 au 8 octobre 2015
 
  9 Leger G., Barragan M., A hybrid method for feature selection in the context of Alternate Test, International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD'15), pp. 1-4, Istanbul, TURKEY, 7 au 9 septembre 2015
 
 10 Renaud G., Barragan M., Mir S., Design of an on-chip stepwise ramp generator for ADC static BIST applications, IEEE International Mixed-Signal Testing Workshop (IMS3TW'15), pp. 1-6, Paris, FRANCE, DOI: 10.1109/IMS3TW.2015.7177876, 24 au 26 juin 2015
 
 11 Malloug H., Barragan M., Mir S., Evaluation of harmonic cancellation techniques for sinusoidal signal generation in mixed-signal BIST, IEEE International Mixed-Signal Testing Workshop (IMS3TW'15), Paris, FRANCE, DOI: 10.1109/IMS3TW.2015.7177877, 24 au 26 juin 2015
 
 12 Pastorelli C., Mellot P., Mir S., Tubert C., Piece-wise-linear ramp ADC for CMOS imager sensor and calibration techniques, International Image Sensor Workshop (IISW'15), Vaals, NETHERLANDS, 8 au 11 juin 2015
 
 13 Le-Gall H., Alhakim R., Valka M., Mir S., Stratigopoulos H., Simeu E., High Frequency Jitter Estimator for SoCs, 20th IEEE European Test Symposium (ETS'15), Cluj-Napoca, ROMANIA, DOI: 10.1109/ETS.2015.7138760, 25 au 29 mai 2015
 
 14 Fei R., Moreau J., Mir S., Marcellin A., Mandier G., Huiss E., Palmigiani G., Vitrou P., Droniou T., Horizontal-FPN fault coverage improvement in production test of CMOS imagers, 33rd IEEE International VLSI Test Symposium (VTS'15), Napa, California, UNITED STATES, DOI: 10.1109/VTS.2015.7116278, 27 au 29 avril 2015
 
 15 Barragan M., Leger G., Azais F., Blanton R.D., Singh Adit D., Sunter S., Special session: Hot topics: Statistical test methods, VLSI Test Symposium (VTS), 2015 IEEE 33rd, pp. 1-2, Napa, CA, UNITED STATES, DOI: 10.1109/VTS.2015.7116265, 27 au 29 avril 2015
 
 16 Liaperdos J., Stratigopoulos H., Abdallah L., Tsiatouhas Y., Arapoyanni A., Li X., Fast Deployment of Alternate Analog Test Using Bayesian Model Fusion, Design, Automation and Test in Europe Conference (DATE'15), Grenoble, FRANCE, DOI: doi: 10.7873/DATE.2015.0102, 9 au 13 mars 2015
 
 17 Barragan M., Leger G., Feature selection for alternate test using wrappers: application to a LNA case study, Design Automation and Test in Europe Conference (DATE'15), Grenoble, FRANCE, DOI: doi: 10.7873/DATE.2015.0179, 9 au 13 mars 2015
 
 18 Serhan A., Abdallah L., Stratigopoulos H., Mir S., Low-cost EVM built-in test of RF transceivers, 9th IEEE International Design and Test Symposium (IDT'14), pp. 51-54, Algiers, ALGERIA, DOI: 10.1109/IDT.2014.7038586, 16 au 18 décembre 2014
 
 19 Renaud G., Barragan M., Mir S., On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test , 23rd IEEE Asian Test Symposium (ATS'14), pp. 212-217, Hangzhou, CHINA, DOI: 10.1109/ATS.2014.47, 16 au 19 novembre 2014
 
 20 Dubois M., Stratigopoulos H., Mir S., Barragan M., Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs , IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC'14), pp. 1-6, Playa del Carmen, Mexico, MEXICO, DOI: 10.1109/VLSI-SoC.2014.7004153, 6 au 8 octobre 2014
 
 21 Dimakos A., Stratigopoulos H., Siligaris A., Mir S., De Foucauld E., Non-intrusive built-in test for 65nm RF LNA , IEEE International Mixed-signals, Sensors and Systems Test Workshop (IMS3TW'14), Porto Alegre, BRAZIL, DOI: 10.1109/IMS3TW.2014.6997397, 17 au 19 septembre 2014
 
 22 Alhakim R., Simeu E., Efficient tracking design in UWB communication systems , IEEE International Conference on Ultra-Wideband (ICUWB'14), pp. 211-216, Paris, FRANCE, DOI: 10.1109/ICUWB.2014.6958980, 1 au 3 septembre 2014
 
 23 Andraud M., Deluthault A., Dieng M., Azais F., Bernard S., Cauvet P., Comte M., Kervaon T., Kerzerho V., Mir S., Pugliesi-Conti P., Renovell M., Soulier F., Simeu E., Stratigopoulos H., Solutions for the self-adaptation of communicating systems in operation, IEEE International On-line Test Symposium (IOLTS'14), pp. 234-239, Platja d’Aro, SPAIN, DOI: 10.1109/IOLTS.2014.6873705, 7 au 9 juillet 2014
 
 24 Andraud M., Stratigopoulos H., Simeu E., One-shot calibration of RF circuits based on non-intrusive sensors, Design Automation Conference (DAC'14), pp. 1-6, San Francisco, CA, UNITED STATES, DOI: 10.1109/DAC.2014.6881337, 1 au 5 juin 2014
 
 25 Stratigopoulos H., Sunter S., Efficient Monte Carlo-Based Analog Parametric Fault Modelling, IEEE VLSI Test Symposium (VTS'14), pp. 1-6, Napa, CA, UNITED STATES, DOI: 10.1109/VTS.2014.6818741, 13 au 17 avril 2014
 
 26 Ekobo Akoa B., Simeu E., Lebowsky F., Using statistical analysis and artificial intelligence tools for automatic assessment of video sequences, Color Imaging XIX: Displaying, Processing, Hardcopy, and Applications, pp. 1-11, San Francisco, California, UNITED STATES, DOI: 10.1117/12.2044797, 2 au 6 février 2014
 
 27 Alhakim R., Simeu E., Fast-tracking delay-locked loop for UWB communication systems , International Conference on Microelectronics (ICM'13), pp. 1-4, Beirut, LEBANON, DOI: 10.1109/ICM.2013.6734971, 15 au 18 décembre 2013
 
 28 Ekobo Akoa B., Simeu E., Lebowsky F., Using Classification for Video Quality Evaluation, IEEE International Conference on Microelectronics (ICM'13), pp. 1-4, Beirut, LEBANON, DOI: 10.1109/ICM.2013.6734964, 15 au 18 décembre 2013
 
 29 Beznia K., Bounceur A., Mir S., Euler R., Output parameter reduction for an efficient evaluation of alternative test techniques, 28th International Conference on Design of Circuits and Integrated Systems (DCIS'13), pp. 258-263, San Sebastian, SPAIN, 27 au 29 novembre 2013
 
 30 Bentobache M., Bounceur A., Euler R., Kieffer Y., Mir S., New techniques for selecting test frequencies for linear analog circuits, 21st IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'13), pp. 90-95, Istanbul, TURKEY, 7 au 9 octobre 2013
 
 31 Huang K., Stratigopoulos H., Mir S., Fault modeling and diagnosis for nanometric analog circuits, IEEE International Test Conference (ITC'13), Paper PTF3, Anaheim, CA, UNITED STATES, DOI: 10.1109/TEST.2013.6651886, 6 au 13 septembre 2013
 
 32 Abdallah L., Stratigopoulos H., Mir S., Non-intrusive sensors for testing RF circuits, IEEE International Test Conference (ITC'13), Paper PTF2, Anaheim, CA, UNITED STATES, DOI: 10.1109/TEST.2013.6651885, 6 au 13 septembre 2013
 
 33 Ekobo Akoa B., Simeu E., Lebowsky F., Video decoder monitoring using non-linear regression, IEEE 19th International On-Line Testing Symposium (IOLTS'13), pp. 175 - 178 , Chania, GREECE, DOI: 10.1109/IOLTS.2013.6604073, 8 au 10 juillet 2013
 
 34 Fei R., Moreau J., Mir S., BIST of interconnection lines in the pixel matrix of CMOS imagers, 5th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI'13), pp. 174-177, Bari, ITALY, DOI: 10.1109/IWASI.2013.6576068, 13 au 14 juin 2013
 
 35 Stratigopoulos H., Faubet P., Courant Y., Mohamed F., Multidimensional analog test metrics estimation using extreme value theory and statistical blockade , 50th ACM / EDAC / IEEE Design Automation Conference (DAC'13), Austin, TX, UNITED STATES, 29 mai 2013
 
 36 Abdallah L., Stratigopoulos H., Mir S., Altet J., Defect-Oriented Non-Intrusive RF Test Using On-Chip Temperature Sensors, IEEE VLSI Test Symposium (VTS'13), Berkeley, CA, UNITED STATES, DOI: 10.1109/VTS.2013.6548889, 29 avril 2013
 
 37 Laraba A., Stratigopoulos H., Mir S., Naudet H., Bret G., Reduced code linearity testing of pipeline adcs in the presence of noise , IEEE VLSI Test Symposium (VTS'13), Berkeley, CA, UNITED STATES, DOI: 10.1109/VTS.2013.6548913, 29 avril 2013
 
 38 Bousquet L., Simeu E., System-level modeling of electromechanical devices with energy consumption, 7th International IEEE Systems Conference (Syscon'13), pp. 756-761, Orlando, Florida, UNITED STATES, DOI: 10.1109/SysCon.2013.6549968, 15 au 18 avril 2013
 
 39 Huang K., Stratigopoulos H., Abdallah L., Mir S., Bounceur A., Multivariate Statistical Techniques for Analog Parametric Test Metrics Estimation, 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS'13), pp. 06-11, Abu Dhabi, UNITED ARABIAN EMIRATES, 26 au 28 mars 2013
 
 40 Beznia K., Bounceur A., Mir S., Euler R., Statistical Modelling of Analog Circuits for Test Metrics Computation, 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS'13), pp. 25-29, Abu Dhabi, UNITED ARABIAN EMIRATES, 26 au 28 mars 2013
 
 41 Ekobo Akoa B., Simeu E., Lebowsky F., Using Artificial Neural Network for Automatic Assessment of Video Sequences , 27th International Conference on Advanced Information Networking and Applications Workshops (WAINA'13), pp. 285-290, Barcelona, SPAIN, DOI: 10.1109/WAINA.2013.191, 25 au 28 mars 2013
 
 42 Beznia K., Bounceur A., Abdallah L., Huang K., Mir S., Euler R., Accurate estimation of analog test metrics with extreme circuits, 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS'12), pp. 272 - 275, Sevilla, SPAIN, DOI: 10.1109/ICECS.2012.6463748, 9 au 12 décembre 2012
 
 43 Bounceur A., Euler R., Saoud B., Beznia K., Mir S., A tool for statistical modeling by means of Copulas of analog and mixed-signal circuits, 27th International Conference on Design of Circuits and Integrated Systems (DCIS'12), pp. 256-260, Avignon, FRANCE, 28 au 30 novembre 2012
 
 44 Abdallah L., Stratigopoulos H., Mir S., Kelma C., Experiences with non-intrusive sensors for RF built-in test, IEEE International Test Conference (ITC'12), Paper 17.1, Anaheim, CA, UNITED STATES, DOI: 10.1109/TEST.2012.6401587 , 5 au 8 novembre 2012
 
 45 Laraba A., Stratigopoulos H., Mir S., Naudet H., Forel C., Enhanced Reduced Code Linearity Test Technique for Multi-bit/Stage Pipeline ADCs, 17th IEEE European Test Symposium (ETS’12), Annecy, FRANCE, DOI: 10.1109/ETS.2012.6233009, 28 mai 2012
 
 46 Dubois M., Stratigopoulos H., Mir S., Ternary Stimulus for Fully Digital Dynamic Testing of SC ΣΔ ADCs , IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW'12), pp. 5 - 10 , Taipei, TAIWAN, DOI: 10.1109/IMS3TW.2012.12, 14 au 16 mai 2012
 
 47 Bousquet L., Simeu E., High-level Modeling of Power Consumption in Active Linear Analog Circuits, 22nd Great Lakes Symposium on Very Large Scale Integration (GLSVLSI'12), pp. 87-90, Salt Lake City, Utah, UNITED STATES, DOI: 10.1145/2206781.2206804, 3 au 4 mai 2012
 
 48 Akkouche N., Mir S., Simeu E., Slamani M., Analog/RF test ordering in the early stages of production testing , 30th IEEE VLSI Test Symposium (VTS'12), pp. 25-30 , Hawaii, UNITED STATES, DOI: 10.1109/VTS.2012.6231075, 23 au 25 avril 2012
 
 49 Alhakim R., Raoof K., Simeu E., Design of Tracking Loop for UWB Systems, International Conference on Information Processing and Wireless Systems (IP-WIS'12), pp. 1-5, Sousse, TUNISIA, 16 au 18 mars 2012
 
 50 De Jonghe D., Maricau E., Gielen G., McConaghy T., Tasic B., Stratigopoulos H., Advances in variation-aware modeling, verification, and testing of analog ICs , IEEE Design, Automation and Test in Europe Conference, pp. 1615 - 1620 , Dresden, GERMANY, 12 au 16 mars 2012
 
 51 Lévêque A., Pêcheux F., Louërat M.-M., Aboushady A., Cenni F., Scotti S., Massouriz A., Clavierz L., Holistic Modeling of Embedded Systems with Multi-Discipline Feedback: Application to a Precollision Mitigation Braking System, Design, Automation and Test in Europe (DATE'12), pp. 739-744, Dresden, GERMANY, 12 au 16 mars 2012
 
 52 Abdallah L., Stratigopoulos H., Mir S., Altet J., Testing RF Circuits With True Non-Intrusive Built-In Sensors, IEEE Design, Automation and Test in Europe (DATE'12), pp. 1090-1095, Dresden, GERMANY, 12 au 16 mars 2012
 
 53 Kupp N., Stratigopoulos H., Drineas P., Makris Y., On Proving the Efficiency of Alternative RF Tests, IEEE/ACM International Conference on Computer-Aided Design (ICCAD'11), pp. 762 - 767 , San Jose, CA, UNITED STATES, DOI: 10.1109/ICCAD.2011.6105415 , 7 au 10 novembre 2011
 
 54 Cenni F., Scotti S., Simeu E., A SystemC AMS/TLM platform for CMOS video sensors , IEEE Conference on Design and Architectures for Signal and Image Processing (DASIP’11), pp. 1-6, Tampere, FINLAND, DOI: 10.1109/DASIP.2011.6136873 , 2 au 4 novembre 2011
 
 55 Spyronasios A., Abdallah L., Stratigopoulos H., Mir S., On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study, IEEE Asian Test Symposium (ATS’11), pp. 365-370, New Delhi, INDIA, DOI: 10.1109/ATS.2011.44 , 2 au 23 novembre 2011
 
 56 Cenni F., Scotti S., Simeu E., SystemC-AMS behavioral modeling of a CMOS video sensor, 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC’11), pp. 380 - 385 , Hong Kong, CHINA, DOI: 10.1109/VLSISoC.2011.6081614 , 3 au 5 octobre 2011
 
 57 Alhakim R., Raoof K., Simeu E., Serrestou Y., Data-aided timing estimation in UWB communication systems using dirty templates, IEEE International Conference on Ultra Wideband (ICUWB’11), pp. 435 - 439 , Bologna, ITALY, DOI: 10.1109/ICUWB.2011.6058880 , 14 au 16 septembre 2011
 
 58 Cenni F., Scotti S., Simeu E., Behavioral modeling of a CMOS video sensor platform using SystemC AMS / TLM, IEEE Forum for Design Languages (FDL’11), pp. 1-6, Oldenburg, GERMANY, 13 au 15 septembre 2011
 
 59 Alhakim R., Simeu E., Raoof K., Internal model control for a self-tuning Delay-Locked Loop in UWB communication systems , 17th IEEE International On-Line Testing Symposium (IOLT’11), pp. 121 - 126 , Athens, GREECE, DOI: 10.1109/IOLTS.2011.5993822 , 13 au 15 juillet 2011
 
 60 Vittoz S., Rufer L., Rehder G.P., Srnanek R., Kovac J., Study of built-in stress distribution in AlGaN/GaN/AlN heterostructure based cantilevers for mechanical sensing in harsh environments , 4th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI’11), pp. 17-20, Brindisi, ITALY, DOI: 10.1109/IWASI.2011.6004678 , 28 au 29 juin 2011
 
 61 Beznia K., Bounceur A., Mir S., Euler R., Parametric test metrics estimation using non-Gaussian copulas, IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW’11), pp. 48-52, Santa Barbara, Ca, UNITED STATES, DOI: 10.1109/IMS3TW.2011.19, 16 au 18 mai 2011
 
 62 Kupp N., Stratigopoulos H., Drineas P., Makris Y., PPM-Accuracy Error Estimates for Low-Cost Analog Test: A Case Study, IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW’11), Santa Barbara, California, UNITED STATES, 16 au 18 mai 2011
 
 63 Esteves J., Rufer L., Rehder G.P., Capacitive Microphone fabricated with CMOS MEMS Surface-Micromachining Technology, Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'11), pp. 309-314, Aix-en Provence, FRANCE, 11 au 13 mai 2011
 
 64 Bousquet L., Cenni F., Simeu E., SystemC-AMS high-level modeling of linear analog blocks with power consumption information, IEEE 12th IEEE Latin American Test Workshop (LATW’11), pp. 1-6, Porto de Galinhas, BRAZIL, DOI: 10.1109/LATW.2011.5985924 , 27 au 30 mars 2011
 
 65 Huang K., Stratigopoulos H., Mir S., Bayesian fault diagnosis of RF circuits using nonparametric density estimation, IEEE Asian Test Symposium (ATS’10), pp. 295-298, Shanghai, CHINA, DOI: 10.1109/ATS.2010.57 , 1 au 4 décembre 2010
 
 66 Stratigopoulos H., Mir S., Analog test metrics estimates with PPM accuracy, IEEE/ACM International Conference on Computer-Aided Design (ICCAD'10), pp. 241-247, San Jose, CA, UNITED STATES, DOI: 10.1109/ICCAD.2010.5654165 , 7 au 11 novembre 2010
 
 67 Zhou Z., Wong M., Rufer L., The Design, Fabrication and Characterization of a Piezoresistive Tactile Sensor for Fingerprint Sensing, 9th Annual IEEE Conference on Sensors, pp. 2589 - 2592 , Waikoloa, HI, UNITED STATES, DOI: 10.1109/ICSENS.2010.5690176 , 1 au 4 novembre 2010
 
 68 Maliuk D., Stratigopoulos H., Huang K., Makris Y., Analog neural network design for RF built-in self-test, IEEE International Test Conference (ITC'10), pp. 23.2, Austin, TX, UNITED STATES, DOI: 10.1109/TEST.2010.5699272 , 31 octobre 2010
 
 69 Edwards M.J., Vittoz S., Amen R., Rufer L., Johander P., Bowen C.R., Allsopp D.W.E., Modelling and optimisation of a sapphire/GaN-based diaphragm structure for pressure sensing in harsh environments, 8th International Conference on Advanced Semiconductor Devices Microsystem (ASDAM'10), pp. 127-130, Smolenice, SLOVAKIA, DOI: 10.1109/ASDAM.2010.5666320 , 25 au 27 octobre 2010
 
 70 Khereddine R., Abdallah L., Simeu E., Mir S., Cenni F., Adaptive Logical Control of RF LNA performances for efficient energy consumption, 18th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'10), pp. 161-166, Madrid, SPAIN, 27 au 29 septembre 2010
 
 71 Alhakim R., Raoof K., Simeu E., A Novel Fine Synchronization Method for Dirty Template UWB Timing Acquisition, 6th International Conference on Wireless Communications Networking and Mobile Computing (WiCOM'10), pp. 4 p., Chengdu, CHINA, 23 au 25 septembre 2010
 
 72 Vittoz S., Rufer L., Rehder G.P., Heinle U., Benkart P., Analytical and numerical modeling of AlGaN/GaN/AlN heterostructure based cantilevers for mechanical sensing in harsh environments, European Conference on sensors, actuators and microsystems (Eurosensors'10), pp. 91-94, Linz, AUSTRIA, DOI: 10.1016/j.proeng.2010.09.055, 5 au 8 septembre 2010
 
 73 Tongbong J., Abdallah L., Mir S., Stratigopoulos H., Evaluation of built-in sensors for RF LNA response measurement, 16th IEEE International Mixed-signals, Sensors and Systems Test Workshop (IMS3TW'10), La Grande Motte, FRANCE, DOI: 10.1109/IMS3TW.2010.5502996 , 7 au 9 juin 2010
 
 74 Abdallah L., Stratigopoulos H., Kelma C., Mir S., Sensors for built-in alternate RF test, IEEE European Test Symposium (ETS’10), pp. 49-54, Prague, CZECH REPUBLIC, DOI: 10.1109/ETSYM.2010.5512783 , 24 au 28 mai 2010
 
 75 Arthaud Y., Rufer L., Mir S., Study of a 3D MEMS-based tactile vibration sensor for the use in the middle ear surgery, International Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP’10), pp. 266-271, Sevilla, SPAIN, 5 au 7 mai 2010
 
 76 Akkouche N., Mir S., Simeu E., Ordering of analog specification tests based on parametric defect level estimation, 28th IEEE VLSI Test Symposium (VTS'10), pp. 301 - 306 , Santa Cruz, UNITED STATES, DOI: 10.1109/VTS.2010.5469546 , 19 au 22 avril 2010
 
 77 Huang K., Stratigopoulos H., Mir S., Fault diagnosis of analog circuits based on machine learning, Design, Automation and Test in Europe Conference (DATE’10) Germany, pp. 1761-1766, Dresden, GERMANY, 8 au 12 mars 2010
 
 78 Rehder G.P., Mir S., Rufer L., Simeu E., Nguyen H.N., Low Frequency Test for RF MEMS Switches, IEEE International Symposium on Electronic Design, Test and Applications (DELTA’10), pp. 350-354, Ho Chi Minh City, VIET NAM, DOI: 10.1109/DELTA.2010.16 , 13 au 15 janvier 2010
 
 79 Tounsi F., Rufer L., Mezghani B., Masmoudi M., Mir S., Highly Flexible Membrane Systems for Micromachined Microphones – Modeling and Simulation, 3rd IEEE International Conference on Signals, Circuits and Systems, (SCS'09), DJerba, TUNISIA, 6 au 8 novembre 2009
 
 80 Cenni F., Simeu E., Mir S., Macro-modeling of analog blocks for SystemC-AMS simulation: A chemical sensor case-study, 17th IFIP International Conference on Very Large Scale Integration (VLSI-SoC’09), Florianapolis, BRAZIL, 12 octobre 2009
 
 81 Dubois M., Stratigopoulos H., Mir S., Hierarchical parametric test metrics estimation: A sigma-delta converter BIST case-study, 27th IEEE International Conference on Computer Design (ICCD’09), pp. 78-83, Lake Tahoe, California, UNITED STATES, DOI: 10.1109/ICCD.2009.5413173 , 4 au 7 octobre 2009
 
 82 Cenni F., Mir S., Rufer L., Behavioral modeling and simulation of a chemical sensor with its microelectronics front-end interface, 3rd IEEE International Workshop on Advances in Sensors and Interfaces (IWASI’09), pp. 92-97, Trani, ITALY, DOI: 10.1109/IWASI.2009.5184776, 25 au 26 juin 2009
 
 83 Zhou Z., Rufer L., Wong M., Aero-Acoustic Microphone with Layer-Transferred Single-Crystal Silicon Piezoresistors, 15th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers’09), pp. 1916-1919, Denver Colorado, UNITED STATES, 21 au 25 juin 2009
 
 84 Stratigopoulos H., Mir S., Acar E., Ozev S., Defect filter for alternate RF test, IEEE European Test Symposium (ETS’09), pp. 101-106 , Sevilla, SPAIN, DOI: 10.1109/ETS.2009.32, 25 au 29 mai 2009
 
 85 Lizarraga L., Mir S., Sicard G., Experimental validation of a BIST technique for CMOS active pixel sensors, 27th IEEE VLSI Test Symposium (VTS’09), pp. 189-194, Santa Cruz, UNITED STATES, DOI: 10.1109/VTS.2009.30, 3 au 7 mai 2009
 
 86 Asquini A., Bounceur A., Mir S., Badets F., Carbonero J.L., Bouzaida L., DFT technique for RF PLLs using built-in monitors , Design and Technology of Integrated Systems (DTIS’09), pp. 210-215, Cairo, EGYPT, 6 au 7 avril 2009
 
 87 Tounsi F., Mezghani B., Rufer L., Mir S., Masmoudi M., Electromagnetic modelling of an integrated micromachined inductive microphone, Design and Technology of Integrated Systems (DTIS’09), pp. 38-44, Cairo, EGYPT, DOI: 10.1109/DTIS.2009.4938020, 6 au 7 avril 2009
 
 88 Stratigopoulos H., Mir S., Makris Y., Enrichment of limited training sets in machine-learning-based analog/RF Test, Design, Automation and Test in Europe Conference (DATE’09), pp. 1668 - 1673 , Nice, FRANCE, 2 au 24 avril 2009
 
 89 Khereddine R., Simeu E., Mir S., Parameter identification of RF transceiver blocks using regressive models, IFAC Workshop on Programmable Devices and Embedded Systems (PDeS’09), pp. 67-72, Roznov pod Radhostem, CZECH REPUBLIC, 1 au 12 février 2009
 
 90 Lechuga Y., Bounceur A., Mozuelos R., Martinez M., Bracho S., Mir S., Test limit evaluation for an ADC Design-for-Test approach by using a CAT platform, 23rd International Conference on Design of Circuits and Integrated Systems (DCIS’08), Grenoble, FRANCE, 12 au 14 novembre 2008
 
 91 Lalinsky T., Rufer L., Vanko G., Ryger I., Hascik S., Tomaska M., Mozolova Z., Vincze A., Surface acoustic wave excitation on SF6 plasma treated AlGaN/GaN heterostructure, The 7th International Conference Advanced Semiconductor Devices Microsystems (ASDAM’08), pp. 311-314 , Smolenice Castle, SLOVAKIA, DOI: 10.1109/ASDAM.2008.4743346, 12 au 16 octobre 2008
 
 92 Lalinsky T., Ryger I., Rufer L., Vanko G., Hascik S., Mozolova Z., Tomaska M., Vincze A., Surface Acoustic Wave Excitation on SF6 plasma treated AlGaN/GaN heterostructure, 12th Joint Vacuum Conference, 10th European Vacuum Conference, 7th Annual Meeting of the German Vacuum Society, Balatonalmádi, Lake Balaton , HUNGARY, 22 au 26 septembre 2008
 
 93 Kupka R., Simeu E., Stratigopoulos H., Rufer L., Mir S., Tumova O., Signature analysis for MEMS pseudorandom testing using neural networks, 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, pp. 321-325, Annecy, FRANCE, 3 au 5 septembre 2008
 
 94 Courtois B., Charlot B., Di Pendina G., Rufer L., Electronics manufacturing infrastructures for education and commercialization, 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBS’08), pp. 1571-1574 , Vancouver, CANADA, 20 au 25 août 2008
 
 95 Bounceur A., Mir S., Estimation of test metrics for AMS/RF BIST using Copulas, 14th IEEE International Mixed-Signals, Sensors and Systems Test Workhop (IMS3TW’08), Vancouver, CANADA, DOI: 10.1109/IMS3TW.2008.4581615 , 18 au 20 juin 2008
 
 96 Courtois B., Charlot B., Di Pendina G., Rufer L., Infrastructures for mixed signals in biology and medicine, 14th IEEE Int. Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW’08), pp. 1-4, Vancouver, CANADA, DOI: 10.1109/IMS3TW.2008.4581622 , 18 au 20 juin 2008
 
 97 Asquini A., Badets F., Mir S., Carbonero J.L., Bouzaida L., PFD output monitoring for RF PLL BIST, 14th IEEE International Mixed-Signals, Sensors and Systems Test Workhop (IMS3TW’08), Vancouver, CANADA, DOI: 10.1109/IMS3TW.2008.4581625 , 18 au 20 juin 2008
 
 98 Dardig J., Stratigopoulos H., Stern E., Reed M., Makris Y., A Statistical Approach to Characterizing and Testing Functionalized Nanowires, IEEE VLSI Test Symposium (VTS’08), pp. 267-274 , San Diego, Ca, UNITED STATES, DOI: 10.1109/VTS.2008.19, 27 avril au 1 mai 2008
 
 99 Khereddine R., Simeu E., Mir S., RF transceiver parameter identification using regressive models, International Conference on Design and Technology of Integrated Systems (DTIS’08), pp. 166, Tozeur, TUNISIA, DOI: 10.1109/DTIS.2008.4540208 , 25 au 27 mars 2008
 
100 Stratigopoulos H., Tongbong J., Mir S., A general method to evaluate RF BIST techniques based on non-parametric density estimation , IEEE Design Automation and Test in Europe (DATE'08), pp. 68-73, Munich, GERMANY, DOI: 10.1109/DATE.2008.4484662, 10 au 14 mars 2008
 
101 Jean-Mistral C., Basrour S., Chaillout J.J., Dielectric polymer: scavenging energy from human motion, Electroactive Polymer Actuators and Devices (EAPAD'08), Orlando, UNITED STATES, 9 au 13 mars 2008
 
102 Rolindez L., Mir S., Carbonero J.L., Goguet D., Chouba N., A Stereo Audio ΣΔ ADC Architecture with Embedded SNDR Self-Test, IEEE International Test Conference (ITC’07), Paper 32.1, Santa Clara, UNITED STATES, 23 au 25 octobre 2007
 
103 Lizarraga L., Mir S., Sicard G., Evaluation of a BIST technique for CMOS imagers, IEEE Asian Test Symposium (ATS’07) , pp. 378-383 , Beijing, CHINA, 8 au 11 octobre 2007
 
104 Akkouche N., Bounceur A., Mir S., Simeu E., Minimization of functional tests by statistical modelling of analogue circuits, International Conference on Design and Technology of Integrated Systems (DTIS’07), pp. 35-40, Rabat, MOROCCO, 2 au 5 septembre 2007
 
105 Lalinsky T., Rufer L., Vanko G., Mir S., AlGaN/GaN heterostructure based surface acoustic wave structures for chemical sensors, 11th International Conference on the Formation of Semiconductor Interfaces (ICFSI’07), Manaus, BRAZIL, 19 au 24 août 2007
 
106 Simeu E., Mir S., Khereddine R., Nguyen H.N., Envelope detection based transition time supervision for online testing of RF MEMS switches, IEEE International On-Line Test Symposium (IOLT’07), pp. 237-243, Crete, GREECE, DOI: 10.1109/IOLTS.2007.30, 8 au 11 juillet 2007
 
107 Akkouche N., Bounceur A., Mir S., Simeu E., Functional test compaction by statistical modelling of analogue circuits, 13th IEEE International Mixed-Signals Testing Workhop (IMSTW’07), pp. 20-24, Porto, PORTUGAL, 18 au 20 juin 2007
 
108 Simeu E., Nguyen H.N., Cauvet P., Mir S., Rufer L., Khereddine R., Using signal envelope detection for RF MEMS switch testing, 13th IEEE International Mixed-Signals Testing Workhop (IMSTW’07), pp. 68-73, Porto, PORTUGAL, 18 au 20 juin 2007
 
109 Asquini A., Carbonero J.L., Mir S., Test measurements evaluation for VCO and charge pump blocks in RF PLLs, SPIE International Symposium on Microtechnologies for the New Millenium, VLSI Circuits and Systems Conference, pp. 1A1-1A8, Gran Canaria, SPAIN, DOI: 10.1117/12.721819 , 10 mai 2007
 
110 Stratigopoulos H., Drineas P., Slamani M., Makris Y., Non-RF to RF test correlation using learning machines: a case-study, 25th IEEE VLSI Test Symposium, (VTS’07), pp. 9-14, Berkeley, UNITED STATES, DOI: 10.1109/VTS.2007.41, 6 au 10 mai 2007
 
111 Tongbong J., Mir S., Carbonero J.L., Evaluation of test measures for LNA production testing using a multinormal statistical model, IEEE Design, Automation & Test in Europe Conference & Exhibition (DATE '07), pp. 731-736, Nice, FRANCE, DOI: 10.1109/DATE.2007.364682, 16 au 20 avril 2007
 
112 Lizarraga L., Mir S., Sicard G., Dragulinescu A., Defect and fault modelling of CMOS active pixel sensors, IEEE Latin American Test Workshop (LATW’07), Cuzco, PERU, 11 au 14 mars 2007
 
113 Alam M.O., Dan Y., Wu B.Y., Chan Y.C., Rufer L., Solid State growth kinetics of complex intermetallics in the Pb-free Ball Grid Array (BGA) solder joint for MEMS Packaging, 8th Electronics Packaging Technology Conference (EPTC'06) , pp. 211-213, Singapore, SINGAPORE, DOI: 10.1109/EPTC.2006.342717, 6 au 8 décembre 2006
 
114 Dragulinescu A., Lizarraga L., Mir S., Sicard G., Defect and fault modelling of a CMOS n-diffusion photodiode, 3rd International Conference on Advanced Topics in Optoelectronics, Microelectronics and Nanotechnologies (ATOM-N’06), pp. 43-44, Bucharest, ROMANIA, 24 au 26 novembre 2006
 
115 Rolindez L., Mir S., Carbonero J.L., Design of a 96-dB audio Sigma-Delta ADC including a BIST technique for SNDR testing, 21st Conference on Design of Circuits and Integrated Systems (DCIS’06), Barcelona, SPAIN, 22 au 24 novembre 2006
 
116 Dhayni A., Mir S., Rufer L., Bounceur A., Characterization and testing of MEMS nonlinearities, International Design and Test Symposium (IDT’06), Dubai, UNITED ARABIAN EMIRATES, 19 au 20 novembre 2006
 
117 Bounceur A., Mir S., Simeu E., Rolindez L., CAT platform for analogue and mixed-signal test evaluation and optimization , 14th IFIP International Conference on Very Larage Scale Integration (VLSI-SoC’06), pp. 320-325, Nice, FRANCE, 16 au 18 octobre 2006
 
118 Rufer L., Lalinsky T., Grobelny D., Mir S., Vanko G., Oszi Z., Mozolova Z., Gregus J., GaAs and GaN based SAW chemical sensors: acoustic part design and technology , 6th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM’06), pp. 165-168, Smolenice, SLOVAKIA, 16 au 18 octobre 2006
 
119 Lizarraga L., Mir S., Sicard G., Bounceur A., Study of a BIST technique for CMOS active pixel sensors, 14th IFIP International Conference on Very Large Scale Integration (VLSI-SoC’06), pp. 326-331, Nice, FRANCE, 16 au 18 octobre 2006
 
120 Grobelny D., Rufer L., Simulation of SAW-based chemical sensor, WOFEX 2006, pp. 213-218, Ostrava, CZECH REPUBLIC, 21 au 22 septembre 2006
 
121 Bounceur A., Mir S., Simeu E., Rolindez L., Estimation of test metrics for multiple analogue parametric deviations, International Conference on Design and Technology of Integrated Systems (DTIS'06), pp. 234-239, Tunis, TUNISIA, 5 au 7 septembre 2006
 
122 Bounceur A., Mir S., Rolindez L., Simeu E., On the accurate estimation of test metrics for multiple analogue parametric deviations, 12th International Mixed-Signals Testing Workshop (IMSTW’06), pp. 19-26, Edinburgh, UNITED KINGDOM, 21 au 23 juin 2006
 
123 Dhayni A., Mir S., Rufer L., Pseudorandom functional BIST for MEMS, 12th International Mixed-Signals Testing Workshop (IMSTW’06), pp. 143-149, Edinburgh, UNITED KINGDOM, 21 au 23 juin 2006
 
124 Rolindez L., Mir S., Bounceur A., Carbonero J.L., A SNDR BIST for SigmaDelta Analogue-to-Digital Converters, 24th IEEE VLSI Test Symposium (VTS'06), pp. 314-319, Berkeley, CA, UNITED STATES, DOI: 10.1109/VTS.2006.12, 30 avril 2006
 
125 Dhayni A., Mir S., Rufer L., Bounceur A., Pseudorandom Functional BIST for Linear and Nonlinear MEMS, IEEE Design, Automation and Test in Europe Conference (DATE '06), pp. 664-669, Munich, GERMANY, 6 au 10 mars 2006
 
126 Alam M.O., Chan Y.C., Rufer L., Effect of Au and Ni layer thicknesses on the reliability of BGA solder joints, International Symposium on Electronics Materials and Packaging (EMAP'05), pp. 88-94, Tokyo, JAPAN, DOI: 10.1109/EMAP.2005.1598241, 11 au 14 décembre 2005
 
127 Rufer L., Torres A., Mir S., Alam M.O., Lalinsky T., Chan Y.C., SAW chemical sensors based on AlGaN/GaN piezoelectric material system: acoustic design and packaging considerations, International Symposium on Electronics Materials and Packaging (EMAP'05), pp. 204-208, Tokyo, JAPAN, DOI: 10.1109/EMAP.2005.1598262, 11 au 14 décembre 2005
 
128 Dhayni A., Mir S., Rufer L., Bounceur A., On-chip pseudorandom testing for linear and nonlinear MEMS, International Conference on Very Larage Scale Integration (VLSI-SoC’05), pp. 435-440, Perth, AUSTRALIA, 17 au 19 octobre 2005
 
129 Matakias S., Tsiatouhas Y., Arapoyanni A., Haniotakis Th., Prenat G., Mir S., A built-in IDDQ testing circuit, 31st European Solid-State Circuits Conference (ESSCIRC'05), pp. 471-474, Grenoble, FRANCE, DOI: 10.1109/ESSCIR.2005.1541662, 12 au 16 septembre 2005
 
130 Rolindez L., Mir S., Bounceur A., Carbonero J.L., A digital bist for a 16-bit audio sigma-delta analogue-to-digital converter, 11th Annual International Mixed-Signals Testing Workshop (IMSTW'05), pp. 45-52, Cannes, FRANCE, 27 au 29 juin 2005
 
131 Dhayni A., Mir S., Rufer L., Bounceur A., Nonlinearity effects on MEMS on-chip pseudorandum testing, 11th Annual International Mixed-Signals Testing Workshop (IMSTW'05), pp. 224-233, Cannes, FRANCE, 27 au 29 juin 2005
 
132 Simeu E., Mir S., Parameter identification based diagnosis in linear and non-linear mixed-signal systems , International Mixed-Signals Testing Workshop (IMSTW'05), pp. 140-147, Cannes, FRANCE, 27 au 29 juin 2005
 
133 Ma W., Rufer L., Zohar Y., Wong M., Design and implementation of an integrated floating-gate electrostatic power micro-generator, 13th International Conference on Solid State Sensors, Actuators and Microsystems (TRANSDUCERS'05) , pp. 299-302, Seoul, KOREA, DOI: 10.1109/SENSOR.2005.1496416, 5 au 9 juin 2005
 
134 Ma W., Wong M., Rufer L., Dynamic simulation of an implemented electrostatic power micro-generator, Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'05), pp. 380-385, Montreux, SWITZERLAND, 1 au 3 juin 2005
 
135 Dhayni A., Mir S., Rufer L., Evaluation of impulse response-based BIST techniques for MEMS in the presence of weak nonlinearities, European Test Symposium (ETS 2005), pp. 82-87, Tallinn, ESTONIA, DOI: 10.1109/ETS.2005.21, 22 au 25 mai 2005
 
136 Rolindez L., Mir S., Prenat G., Digital test of a ΣΔ modulator in a mixed-signal BIST architecture, SPIE Microtechnologies for the New Millennium, VLSI circuits and systems II, pp. 502-512, Sevilla, SPAIN, DOI: 10.1117/12.607615, 9 au 11 mai 2005
 
137 Kheriji R., Danelon V., Carbonero J.L., Mir S., Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach, IEEE Design, Automation and Test in Europe Conference (DATE'05), pp. 170-171, Munich, GERMANY, DOI: 10.1109/DATE.2005.233, 7 au 11 mars 2005
 
138 Kheriji R., Danelon V., Carbonero J.L., Mir S., Optimising test sets for RF components with a defect-oriented approach, 16th International Conference on Microelectronics (ICM'04), pp. 400-403, Tunis, TUNISIA, DOI: 10.1109/ICM.2004.1434597, 6 au 8 décembre 2004
 
139 Bounceur A., Mir S., Simeu E., Optimisation of digitally coded test vectors for mixed-signal components, 19th Conference on Design of Circuits and Integrated Systems (DCIS'04), Bordeaux, FRANCE, 24 au 26 novembre 2004
 
140 Prenat G., Mir S., Vasquez D., Rolindez L., A low-cost digital frequency testing approach for mixed-signal devices using sigma-delta modulation, 10th International Mixed-Signal Testing Workshop (IMSTW'04), Portland, UNITED STATES, 23 au 25 juin 2004
 
141 Dhayni A., Mir S., Rufer L., MEMS Built-In-Self-Test Using MLS, IEEE European Test Symposium (ETS'04), pp. 66-71, Corse, FRANCE, DOI: 10.1109/ETSYM.2004.1347607, 23 au 26 mai 2004
 
142 Rolindez L., Mir S., Prenat G., Bounceur A., A 0.18 mu m CMOS implementation of on-chip analogue test signal generation from digital test patterns, Design, Automation and Test in Europe Conference (DATE'04), pp. 704-705, Dresden, GERMANY, DOI: 10.1109/DATE.2004.1268939, 24 au 28 janvier 2004
 
143 Naal M. A., Simeu E., Mir S., Comparative study of online testing methods for AMS application to decimation filters, International Conference on Information and Communication Technologies: From Theory to Applications (ICTTA'04), pp. 393-394, Damascus, SYRIAN ARAB REPUBLIC, DOI: 10.1109/ICTTA.2004.1307797, 1 janvier 2004
 
144 Domingues C., Mir S., Rufer L., Design of a MEMS-based ultrasonic pulse-echo system, 18th Conference on Design of Circuits and Integrated Systems (DCIS'03), pp. 623-628, Ciudad Real, SPAIN, 18 au 21 novembre 2003
 
145 Rufer L., Mir S., Domingues C., Simeu E., MLS-based technique for MEMS characterization , 3rd International Workshop on Microfabricated Ultrasonic Transducers (MUT'03), pp. 157-164, Lausanne, SWITZERLAND, 26 au 27 juin 2003
 
146 Rufer L., Mir S., Simeu E., Domingues C., On-chip pseudorandom MEMS testing, 9th International Mixed-Signal Testing Workshop (IMSTW'03), pp. 93-98, Sevilla, SPAIN, 25 au 27 juin 2003
 
147 Rufer L., Mir S., Simeu E., Domingues C., On-chip testing of MEMS using pseudo-random test sequences, Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'03) , pp. 50-55, Mandelieu (Cannes), FRANCE, DOI: 10.1109/DTIP.2003.1287007, 5 au 7 mai 2003
 
148 Rufer L., Mir S., Simeu E., On-chip testing of linear time invariant systems using maximum length sequences, IFAC Workshop on Programmable Devices and Systems (PDS'03), pp. 437-440, Ostrava, CZECH REPUBLIC, 11 au 13 février 2003
 
149 Naal M. A., Simeu E., Mir S., On-Line Testable Decimation Filter Design for AMS Systems, 9th IEEE International On-Line Testing Symposium (IOLT'03), pp. 83-88, Kos Island, GREECE, DOI: 10.1109/OLT.2003.1214371, 1 janvier 2003
 
150 Naal M. A., RAKOTOARISOA M.N., Simeu E., Aktouf C., Using concurrent and semi-concurrent on-line testing during HLS: an adaptable approach, Eighth IEEE International On Line Testing Workshop (IOLTW'02), pp. 184, Ile de Bendor, GREECE, DOI: 10.1109/OLT.2002.1030208, 8 au 10 juillet 2002
 
151 Mir S., Rufer L., Domingues C., Behavioral modelling and simulation of a MUT-based pulso-echo system, 2nd International Workshop on Microfabricated Ultrasonic Transducers, pp. 18-24, Besançon, FRANCE, 27 au 28 juin 2002
 
152 Mir S., Diedrich C., Roman C., Domingues C., On-chip test signal generation for acoustic and ultrasound microelectronic interfaces, 8th IEEE International Mixed-Signal Testing Workshop (IMSTW'02), pp. 137-144, Montreux, SWITZERLAND, 13 au 15 juin 2002
 
153 Roman C., Mir S., Charlot B., Building and analogue fault simulation tool and its application to MEMS, 8th IEEE International Mixed-Signal Testing Workshop (IMST3W'02), pp. 65-74, Montreux, SWITZERLAND, 1 juin 2002
 
154 Rufer L., Domingues C., Mir S., Behavioural modelling and simulation of a MEMS-based ultrasonic pulse-echo system, Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'02), pp. 171-182, Cannes, FRANCE, 1 janvier 2002
 
155 Courtois B., Mir S., Charlot B., Lubaszewski M., From microelectronics to MEMS testing, IEEE Microelectronics Reliability and Qualification Workshop , pp. paper VI.8, Glendale, Ca., UNITED STATES, 31 octobre au 1 novembre 2000
 
156 Mir S., Rueda A., Vazquez D., Huertas J.L., Test optimization in switched-capacitor systems through switch-level fault coverage analysis, XII International Conference on Design of Circuits and Integrated Systems (DCIS'97), pp. 125-130, Sevilla, SPAIN, 1 novembre 1997
 
157 Mir S., Kolarik V., Lubaszewski M., Vasquez D., Detectability of differential bridges in balanced circuits, IEEE International Mixed Signal Testing Workshop (IMSTW'96), pp. 23-28, Quebec, CANADA, 1 mai 1996
 
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15 Chapitres de livre

 1 Stratigopoulos H., Kaminska B., Analog and Mixed-Signal Test, Electronic Design Automation for Integrated Circuits , Grant Martin, Luciano Lavagno, and Igor Markov (Eds.) , Ed. CRC Press, pp. , 2015
 
 2 Gines A., Fiorelli R., Villegas A., Doldan R., Barragan M., Vazquez D., Rueda A., Peralias E., Design of an energy efficient ZigBee transceiver, Mixed-Signal Circuits, M. Soma, T. Noulis (Eds.) , Ed. CRC Press, pp. , 2015
 
 3 Bentobache M., Bounceur A., Euler R., Mir S., Kieffer Y., Minimizing test frequencies for linear analog circuits: new models and efficient solution methods, in VLSI-SoC: At the Crossroads of Emerging Trends, A. Orailoglu et al. (Eds.) , Ed. Springer , pp. 188-207, Vol. 461, DOI: 10.1007/978-3-319-23799-2 9, 2015
 
 4 Dubois M., Stratigopoulos H., Mir S., Barragan M., Statistical evaluation of digital techniques for Sigma-Delta ADC BIST, VLSI-SoC: Internet of Things Foundations, Luc Claesen, Maria-Teresa Sanz-Pascual, Ricardo Reis, Arturo Sarmiento-Reyes (Eds.) , Ed. Springer , pp. 129-148, DOI: 10.1007/978-3-319-25279-7 8, 2015
 
 5 Khereddine R., Abdallah L., Simeu E., Mir S., Cenni F., Adaptive logical control of RF LNA performances for efficient energy consumption, in VLSI-SoC: Forward-Looking Trends in IC and Systems Design , J. Ayala, D. Atienza, R. Reis (Eds.) , Ed. Springer , pp. 43-68, Volume 373, DOI: DOI: 10.1007/978-3-642-28566-0_3, 2012
 
 6 Alhakim R., Raoof K., Simeu E., Timing Synchronisation for IR-UWB Communication Systems, Ultra Wideband - Current Status and Future Trends, M. A. Matin (Eds.) , Ed. InTech Europe, Rijeka, Croatia, pp. 15-40, 2012
 
 7 Stratigopoulos H., Makris Y., Checkers for Online Self-Testing of Analog Circuits, Advanced Circuits for Emerging Technologies, Kris Iniewski (Eds.) , Ed. Wiley, Chichester, UK, pp. Chapter 21, DOI: http://onlinelibrary.wiley.com/doi/10.1002/9781118181508.ch21/summary, 2012
 
 8 Bounceur A., Mir S., Rolindez L., Simeu E., CAT platform for analogue and mixed-signal test evaluation and optimization, in VLSI-SoC: Research trends in VLSI and Systems on Chip, G. De Micheli, S. Mir, R. Reis (Eds.) , Ed. Springer , pp. 281-300, Vol. 249, 2007
 
 9 Dhayni A., Mir S., Rufer L., Bounceur A., On-Chip pseudorandom testing for linear and non-linear MEMS, VLSI-SOC: From Systems to Silicon, Reis, Ricardo; Osseiran, Adam; Pfleiderer, Hans-Joerg (Eds.) , Ed. Springer , pp. 245-266, Vol. 240, DOI: DOI 10.1007/978-0-387-73661-7 , 2007
 
10 Charlot B., Martinez S., Mir S., La CAO des microsystèmes, Conception de microsystèmes sur silicium, Ed. Hermès, pp. 129-176, 2002
 
11 Mir S., Parrain F., Les interfaces microélectroniques, Conception de microsystèmes sur silicium , Mir S. (Eds.) , Ed. Hermès, pp. 177-215, 2002
 
12 Mir S., Charlot B., Parrain F., Les microsystèmes thermiques, Dispositifs et physique des microsystèmes sur silicium , Mir S. (Eds.) , Ed. Hermès, pp. 65-104, 2002
 
13 Mir S., Charlot B., Perspectives des microsystèmes sur silicium, Dispositifs et physique des microsystèmes sur silicium, Mir S. (Eds.) , Ed. Hermès, pp. 199-214, 2002
 
14 Mir S., Martinez S., Introduction aux microsystèmes sur silicium, Conception de microsystèmes sur silicium , Mir S. (Eds.) , Ed. Hermès, pp. 19-38, 2002
 
15 Mir S., Charlot B., From Microelectronics to Integrated Microsystems Testing, Microsystems Technology - Fabrication, test and reliability, J. Boussey (Eds.) , Ed. Lavoisier, pp. 241-263, 2002
 
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12 Livres & Ouvrages

 1 Alhakim R., Raoof K., Simeu E. (Eds.) Optimizing the performance of synchronization process: in ultra-wideband communication systems, Ed. LAMBERT Academic Publishing (LAP), 2013
 
 2 Mir S., Tsui C.-Y., Reis R., Choi C.-H. (Eds.) VLSI-SoC: Advanced Research for Systems on Chip, IFIP Advances in Information and Communication Technology , Ed. Springer , 2012
 
 3 Mir S., Tsui C.-Y., Choi C.-H., Reis R. (Eds.) Proceedings of 19th IFIP International Conference on Very Large Scale Integration (VLSI-SoC), Hong-Kong, Ed. IFIP, 2011
 
 4 De Micheli G., Mir S., Reis R. (Eds.) VLSI-SoC: Research Trends in VLSI and Systems on Chip, IFIP Advances in Information and Communication Technology, Ed. Springer , 2007
 
 5 Simeu E., Mir S., De Micheli G., Reis R. (Eds.) Digest of Papers PhD Forum at 14th IFIP International Conference on Very Large Scale Integration (VLSI-SoC), Ed. IFIP, 2006
 
 6 Mir S., De Micheli G., Reis R., Simeu E. (Eds.) Proceedings 14th IFIP International Conference on Very Large Scale Integration (VLSI-SoC’06), Ed. IFIP, 2006
 
 7 Mir S. (Eds.) Proceedings 11th International Mixed-Signals Testing Workshop, Grenoble, France, Ed. , 2005
 
 8 Kaminska B., Sunter S., Mir S. (Eds.) International Mixed-Signals Testing Workshop - IMSTW 2004: Special Issue of Microelectronics Journal, Microelectronics Journal, Ed. Elsevier, 2005
 
 9 Bounceur A. (Eds.) Initiation à la Programmation Objet avec Java : Partie 1, Tutoriaux JAVA, Ed. TIMA Laboratory, 46 avenue Félix Viallet, 38031 Grenoble Cedex, 2005
 
10 Kaminska B., Sunter S., Mir S. (Eds.) Proceedings 10th International Mixed-Signals Testing Workshop, Portland, USA, Ed. , 2004
 
11 Mir S. (Eds.) Conception de microsystèmes sur silicium (Traité EGEM, série Electronique et micro-électronique), Ed. Hermès, 2002
 
12 Mir S. (Eds.) Dispositifs et physique des microsystèmes sur silicium (Traité EGEM, série Electronique et micro-électronique), Ed. Hermès, 2002
 
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1 Revues nationales

1 Mir S., Charlot B., From microelectronics to integrated microsystems testing , Nano et Micro-Technologies, Ed. Hermès, Vol. 2, No. 1-2, pp. 249-270, janvier 2002
 
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37 Conférences nationales

 1 Alhakim R., Simeu E., Novel design of tracking process for UWB communication systems, IEEE AFRICON 2013, Pointe-Aux-Piments, MAURITIUS, DOI: 10.1109/AFRCON.2013.6757755, 9 au 12 septembre 2013
 
 2 Bounceur A., Euler R., Beznia K., Mir S., Estimation des métriques de test analogique à base d’un échantillon multivarié de circuits extrêmes, Journées GDR SoC-SiP, Lyon, FRANCE, 11 au 12 juin 2013
 
 3 Beznia K., Bounceur A., Euler R., Mir S., Réduction des paramètres de sortie des circuits analogiques par l’estimation des métriques de test, Journées GDR SoC-SiP, Lyon, FRANCE, 11 au 12 juin 2013
 
 4 Beznia K., Bounceur A., Euler R., Mir S., Estimation des métriques de test analogique à base d’un échantillon multivarié de circuits extrêmes, 16ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'13), Grenoble, FRANCE, 10 juin 2013
 
 5 Alhakim R., Simeu E., Raoof K., A novel design for delay-locked loop using internal model control approach, Journées scientifiques du projet SEmba 2013, Lyon, FRANCE, 4 au 5 avril 2013
 
 6 Fei R., Mir S., Moreau J., Défauts catastrophiques dans les capteurs optiques CMOS 1T75 PIN photodiode, Journées GDR ondes, Grenoble, FRANCE, 17 au 18 janvier 2013
 
 7 Saoud B., Beznia K., Bounceur A., Mir S., Kerkar M., Outil de modélisation statistique des circuits analogiques et mixtes, Journées GDR SoC-SiP, Paris, FRANCE, 13 au 15 juin 2012
 
 8 Beznia K., Bounceur A., Mir S., Euler R., Test metrics computation using the statistical model of analog circuits, Journées GDR SoC-SiP, Paris, FRANCE, 13 au 15 juin 2012
 
 9 Abdallah L., Stratigopoulos H., Mir S., Conception et évaluation d’une technique de test pour un mélangeur RF, Journées GDR SoC-SiP, Lyon, FRANCE, 15 au 17 juin 2011
 
10 Huang K., Stratigopoulos H., Mir S., Diagnostic de fautes de circuits analogiques basé sur l’estimation non paramétrique de densité , Journées GDR SoC-SiP, Lyon, FRANCE, 15 au 17 juin 2011
 
11 Beznia K., Bounceur A., Mir S., Euler R., Evaluation d’un BIST d’un capteur de vision CMOS à base d’une copule non Gaussienne, Journées GDR SoC-SiP, Lyon, FRANCE, 15 au 17 juin 2011
 
12 Bousquet L., Simeu E., Including power consumption information in SystemC-AMS modeling of linear analog blocks at LSF MoC Level, Journées GDR SoC-SiP, Lyon, FRANCE, 15 au 17 juin 2011
 
13 Laraba A., Dubois M., Stratigopoulos H., Mir S., Evaluation de la technique de test basée sur la mesure d’un nombre réduit de codes pour les convertisseurs analogique-numérique de type pipeline, Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’11), Paris, FRANCE, 23 au 25 mai 2011
 
14 Abdallah L., Stratigopoulos H., Mir S., Moniteurs embarqués pour le test à bas coût d’un front-end RF, Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’11), Paris, FRANCE, 23 au 25 mai 2011
 
15 Abdallah L., Stratigopoulos H., Kelma C., Mir S., Capteurs embarqués pour le test alternatif des circuits RF, Journées GDR SoC-SiP, Paris, FRANCE, 9 au 11 juin 2010
 
16 Huang K., Stratigopoulos H., Mir S., Diagnostic de fautes de circuits analogiques basé sur l’apprentissage automatique, Journées GDR SoC-SiP, Paris, FRANCE, 9 au 11 juin 2010
 
17 Dubois M., Stratigopoulos H., Mir S., Evaluation des métriques de test pour des circuits analogiques/mixtes complexes, Journées GDR SoC-SiP, Paris, FRANCE, 9 au 11 juin 2010
 
18 Vittoz S., Rufer L., Modélisation et caractérisation de capteurs mécaniques à base d’hétérostructures AlGaN/GaN pour environnements en conditions sévères, Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'10), Montpellier, FRANCE, 7 au 10 juin 2010
 
19 Abdallah L., Tongbong J., Stratigopoulos H., Mir S., Alternate LNA testing using an envelope detector, Journées GDR SoC-SiP, Paris, FRANCE, 1 au 12 juin 2009
 
20 Arthaud Y., Rufer L., Mir S., Capteur MEMS faible impédance mécanique haute sensibilité pour la chirurgie de l’oreille moyenne, Journées GDR MNS, Montpellier, FRANCE, 3 au 5 décembre 2008
 
21 Schmerber S., Arthaud Y., Rufer L., Mir S., Outils de monitoring per-opératoire de la biomécanique ossiculaire par micro-capteur en chirurgie otologique - Etude de faisabilité, 115eme Congres de la SFORL, Paris, FRANCE, 12 au 14 octobre 2008
 
22 Dubois M., Chouba N., Mir S., Calibrage automatique d’un convertisseur Sigma-Delta utilisant un BIST, 11ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’08), Bordeaux, FRANCE, 14 au 16 mai 2008
 
23 Akkouche N., Mir S., Simeu E., Stratigopoulos H., Réduction de tests fonctionnels en utilisant des techniques d'estimation non paramétrique, 11ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’08), Bordeaux, FRANCE, 14 au 16 mai 2008
 
24 Khereddine R., Simeu E., Mir S., Utilisation des modèles de regression pour l’identification des paramètres d’un transceiver RF, 11ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’08), Bordeaux, FRANCE, 14 au 16 mai 2008
 
25 Rufer L., Arthaud Y., Mir S., Schmerber S., Dauvé S., Noury N., Outil de monitoring per-opératoire dans la chirurgie de l'oreille moyenne, Journées GDR MNS, Toulouse, FRANCE, 21 au 23 novembre 2007
 
26 Nguyen H.N., Rufer L., Simeu E., Mir S., RF MEMS series capacitive switch: test and diagnosis, Journées GDR SoC-SiP, Paris, FRANCE, 13 au 15 juin 2007
 
27 Khereddine R., Simeu E., Mir S., Utilisation des techniques de regression pour le test et le diagnostic des composantes RF , Journées GDR SoC-SiP, Paris, FRANCE, 13 juin 2007
 
28 Akkouche N., Bounceur A., Mir S., Réduction de tests fonctionnels par modélisation statistique des circuits analogiques, 10ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’07), Lille, FRANCE, 14 au 16 mai 2007
 
29 Rufer L., Domingues C., Mir S., Petrini V., Jeannot J.C., Delobelle P., Transducteur ultrasonore microusiné compatible CMOS, Ecole MEMS & Acoustique, Villeneuve d’Ascq, FRANCE, 3 au 4 avril 2007
 
30 Dhayni A., Mir S., Rufer L., Bounceur A., BIST pour les microsystèmes nonlinéaires, Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM'06), Rennes, FRANCE, 10 au 12 mai 2006
 
31 Lizarraga L., Mir S., Sicard G., Vers une technique d’auto test incorporé (BIST) pour des pixels actifs CMOS, Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’06), Rennes, FRANCE, 10 au 12 mai 2006
 
32 Rufer L., Domingues C., Wong M., Dong J., Mir S., Electroacoustic and ultrasonic microtransducers, 8th French Acoustical Congress, pp. 487-490, Tours, FRANCE, 24 au 27 avril 2006
 
33 Kheriji R., Danelon V., Carbonero J.L., Mir S., Test orienté défaut pour les circuits radio fréquences, 14ème Journées Nationales Microondes (JNM’05), Nantes, FRANCE, 11 au 14 mai 2005
 
34 Dhayni A., Mir S., Rufer L., Bounceur A., Autotest Intégré des Microsystèmes Nonlinéaires, 8ème Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM’05), pp. 256-258, Paris, FRANCE, 10 au 12 mai 2005
 
35 Bounceur A., Dhayni A., Mir S., Rufer L., Génération de vecteurs de test pour les MEMS non linéaires pour le calcul des noyaux de Volterra, 8ème Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM’05), pp. 340-342, Paris, FRANCE, 10 au 12 mai 2005
 
36 Bounceur A., Mir S., Simeu E., Génération et optimisation de vecteurs de test pour des composants analogiques et mixtes, 7ème Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM'04), pp. 198-200, Marseille, FRANCE, 4 au 6 mai 2004
 
37 Domingues C., Rufer L., Mir S., Modélisation et simulation d'un microsystème ultrasonore pour une application pulse-echo , 5ème Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM'02), pp. 87-88, Grenoble, FRANCE, 23 au 25 avril 2002
 
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20 Autres communications

 1 Bousquet L., Energy Consumption Information in High-level Models, PhD Forum at IEEE Design, Automation and Test in Europe Conference (DATE'13), Grenoble, FRANCE, 2013
 
 2 Rufer L., Mir S., Analysis of acoustic capacitive transducers, 1st International Workshop on Microfabricated Ultrasonic Transducers, Rome, ITALY, 2001
 
 3 Stratigopoulos H., On-Line monitoring for analog and sensor-based systems, Special session organisation on 16th IEEE International On-Line Testing Symposium (IOLTS'10), Corfy, GREECE, 2010
 
 4 Stratigopoulos H., Mir S., Adaptive alternate analog test, IEEE International Test Workshop on Defect and Adaptive Test Analysis (DATA'12), Anaheim, CA, UNITED STATES, 2012
 
 5 Rufer L., Simeu E., Mir S., Built-in self-test of linear time invariant systems using maximum-length sequences, Poster at IEEE European Test Workshop (ETW'03), pp. 111-112, Maastricht, NETHERLANDS, 2003
 
 6 Tongbong J., Bounceur A., Mir S., Carbonero J.L., Evaluation of test measures for low-cost LNA production testing, PhD Forum at 14th IFIP International Conference on Very Large Scale Integraation (VLSI-SoC’06), pp. 48-52, Nice, FRANCE, 2006
 
 7 Barragan M., Leger G., Feature selection for Alternate Test using wrappers: application to an RF LNA case study, 1st Workshop on Statistical Test Methods (STEM'14), pp. 6, Paderborn, GERMANY, 2014
 
 8 Stratigopoulos H., Adaptive analog test: feasibility and opportunities Ahead, Panel organization on 28th IEEE VLSI Test Symposium (VTS'10), Santa Cruz, California, UNITED STATES, 2010
 
 9 Stratigopoulos H., Sunter S., Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics, 1st Workshop on Statistical Test Methods (Fringe event to ETS 2014), Paderborn, GREECE, 2014
 
10 Stratigopoulos H., Mir S., Tongbong J., A versatile technique for evaluating test measurements at the design stage, 15th IEEE International Mixed-Signals, Sensors and Systems Test Workhop (IMST3W'09), Phoenix, UNITED STATES, 2009
 
11 Bounceur A., Mir S., Rolindez L., Simeu E., A CAT platform for analogue and mixed-signal test evaluation and optimization , Digest of Papers of the IEEE European Test Symposium (ETS’06), pp. 217-222, Southampton, UNITED KINGDOM, 2006
 
12 Paugnat F., Bousquet L., Fesquet L., Analog Design Abstraction Levels and SystemC AMS Models of Computation, SystemC-AMS Day 2011: Industry Adoption of the SystemC AMS Standard, Dresden, GERMANY, 2011
 
13 Rufer L., Mir S., Modelling of silicon electrostatic ultrasonic transducers, 1st International Workshop on Microfabricated Ultrasonic Transducers, Roma, ITALY, 2001
 
14 Paugnat F., Bousquet L., Morin-Allory K., Fesquet L., A Performance Comparison Between the SystemC-AMS Models of Computation, edaWorkshop 2011, pp. 13-18, Dresden, GERMANY, 2011
 
15 Akkouche N., Optimization of production test of analog and RF circuits using statistical modeling techniques, PhD Forum at IEEE Design, Automation and Test in Europe Conference (DATE'11), Grenoble, FRANCE, 2011
 
16 Cenni F., Scotti S., Simeu E., SystemC-AMS model of a CMOS video sensor. Open SystemC Initiative (OSCI) , SystemC AMS Day 2011: Industry Adoption of the SystemC AMS Standard, pp. 42-49, Dresden, GERMANY, 2011
 
17 Nguyen H.N., Simeu E., Rufer L., Mir S., Use of regressive method for RF MEMS test and diagnosis, PhD Forum at International Conference on Very Large Scale Integration (VLSI-Soc'06), pp. 56-61, Nice, FRANCE, 2006
 
18 Dubois M., Test metrics estimation of complex analog and mixed-signal circuits at the design stage, PhD Forum at IEEE Design, Automation and Test in Europe Conference (DATE'11), Grenoble, FRANCE, 2011
 
19 Mir S., Rufer L., Thouraud B.-Z., Simo M., CMOS front-end for capacitive micromachined ultrasonic transducers, 1st International Workshop on Microfabricated Ultrasonic Transducers, Roma, ITALY, 2001
 
20 Bentobache M., Bounceur A., Euler R., Kieffer Y., Mir S., Efficient minimization of test frequencies for linear analog circuits, 13th IEEE European Test Symposium (ETS'13), Avignon, FRANCE, 2013
 
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25 Rapports

 1 Mir S., Rolindez L., Carbonero J.L., Design of a 96-dB Audio SD ADC including a BIST Technique for SNDR Testing , ISRN: TIMA-RR--06/10-02--FR, 1 janvier 2006
 
 2 Bounceur A., Simeu E., Mir S., Rolindez L., Estimation of test metrics for the optimisation of analogue circuit testing , ISRN: TIMA-RR--06/10-03--FR, 1 janvier 2006
 
 3 Dhayni A., Rufer L., Mir S., Bounceur A., On-chip Pseudorandom Testing for Linear and Nonlinear MEMS, ISRN: TIMA-RR--06/10-04--FR, 1 janvier 2006
 
 4 Simeu E., Mir S., Diagnosis in Linear and Nonlinear Mixed-Signal Systems: a Parameter Identification Based Technique, ISRN: TIMA-RR--05/06-01--FR, 1 janvier 2005
 
 5 Ma W., Rufer L., Wong M., Dynamic simulation of an implemented electrostatic power micro-generator, ISRN: TIMA-RR--05/02-03--FR, 1 janvier 2005
 
 6 Rolindez L., Prenat G., Bounceur A., Mir S., A 0.18 ìm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns, ISRN: TIMA-RR--04/05-05--FR, 1 janvier 2004
 
 7 Mir S., Bounceur A., Rolindez L., Prenat G., A 0.18 ìm CMOS Implementation On-chip Analogue Test Signal Generation from Digital Test Patterns, ISRN: TIMA-RR--04/02-02--FR, 1 janvier 2004
 
 8 Prenat G., Vasquez D., Mir S., Rolindez L., A low-cost digital frequency testing approach for mixed-signal devices using sigma delta modulation , ISRN: TIMA-RR--04/05-03--FR, 1 janvier 2004
 
 9 Naal M. A., Mir S., Simeu E., Comparative Study of On-Line Testing Methods for AMS Systems. Application to Decimation Filters, ISRN: TIMA-RR--04/05-02--FR, 1 janvier 2004
 
10 Mir S., Bounceur A., Simeu E., Génération et optimisation de vecteurs de test pour des composants analogiques et mixtes, ISRN: TIMA-RR--04/05-04--FR, 1 janvier 2004
 
11 Dhayni A., Mir S., Rufer L., MEMS Built-in-Self-Test Using MLS , ISRN: TIMA-RR--04/05-06--FR, 1 janvier 2004
 
12 Charlot B., Courtois B., Mir S., Rufer L., On-chip testing of embedded silicon transducers, ISRN: TIMA-RR--04/07-02--FR, 1 janvier 2004
 
13 Mir S., Rufer L., Courtois B., On-chip testing of embedded transducers, ISRN: TIMA-RR--04/05-07--FR, 1 janvier 2004
 
14 Simeu E., Mir S., Rufer L., Online Testing Embedded Systems: Adapting Automatic Control Techniques to Microelectronic Testing , ISRN: ISRN-RR--04/09-01-FR, 1 janvier 2004
 
15 Danelon V., Mir S., Kheriji R., Carbonero J.L., Optimising test sets for RF components with a defect-oriented approach, ISRN: TIMA-RR--05/02-01--FR, 1 janvier 2004
 
16 Simeu E., Rufer L., Mir S., Built-in-self -test of linear time invariant systems using maximum - lenght sequences, ISRN: TIMA-RR--03/07-02--FR, 1 janvier 2003
 
17 Mir S., Integrated circuits testing: from microelectronics to microsystems, ISRN: TIMA-RR--03/07-01--FR, 1 janvier 2003
 
18 Rufer L., Simeu E., Mir S., Domingues C., On-chip pseudorandom MEMS testing, ISRN: TIMA-RR--03/06-01--FR, 1 janvier 2003
 
19 Rufer L., Mir S., Simeu E., On-chip testing of linear time invariant systems using maximum-length sequences, ISRN: TIMA-RR--03/01-01--FR, 1 janvier 2003
 
20 Rufer L., Simeu E., Mir S., Domingues C., On-Chip testing of MEMS using pseudo-random test sequences, ISRN: TIMA-RR--03/03-02--FR, 1 janvier 2003
 
21 Naal M. A., Mir S., Simeu E., On-Line Testable Design: Application to Decimation Filter for AMS Systems, ISRN: TIMA-RR--03/08-01--FR, 1 janvier 2003
 
22 Mir S., Domingues C., Rolindez L., Rufer L., An implementation of memory-based on-chip analogue test signal generation, ISRN: TIMA-RR--02/11-02--FR, 1 janvier 2002
 
23 Domingues C., Rufer L., Mir S., Behavioural modelling and simulation of a MEMS-based ultrasonic pulse-echo system , ISRN: TIMA--RR-02/02/3--FR, 1 janvier 2002
 
24 Charlot B., Parrain F., Mir S., Courtois B., Generation of Electrically Induced Stimuli for MEMS self-test, ISRN: TIMA--RR-02/02/1--FR, 1 janvier 2002
 
25 Mir S., Roman C., Diedrich C., Domingues C., On-chip test signal generation for acoustic and ultrasound microelectronic interfaces, ISRN: TIMA-RR--02/09-01--FR, 1 janvier 2002
 
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30 Thèses

 1 Pastorelli C., Design of an analog-digital converter based on a piecewise linear ramp for image sensor with calibration techniques, These de Doctorat, 15 décembre 2016
 
 2 Renaud G., Pipeline ADC Built-In Self Test, These de Doctorat, 29 novembre 2016
 
 3 Andraud M., Solutions for the self-adaptation of wireless systems, These de Doctorat, 14 juin 2016
 
 4 Dimakos A., Built-in test in RF circuits using non-intrusive sensors, These de Doctorat, 29 mars 2016
 
 5 Fei R., Alternative solution to improve the production test of optical sensors in CMOS technology, These de Doctorat, 13 octobre 2015
 
 6 Stratigopoulos H., Test techniques for Analog Circuits and Systems, HDR, 17 juillet 2015
 
 7 Ekobo Akoa B., Error detection and concealment integrated in a video decoder using technics of statistical analysis, These de Doctorat, 31 octobre 2014
 
 8 Bousquet L., Enriched high level model generation for heterogeneous and multiphysic systems, These de Doctorat, 29 janvier 2014
 
 9 Laraba A., Design-For-Test of pipeline Analog-to-Digital Converters, These de Doctorat, 20 septembre 2013
 
10 Alhakim R., Optimizing the performance of sensor networks by controlling synchronization in ultra-wideband systems, These de Doctorat, 29 janvier 2013
 
11 Abdallah L., Non-intrusive embedded sensors for testing RF circuits, These de Doctorat, 22 octobre 2012
 
12 Cenni F., High level modeling of heterogeneous systems, analog/digital interfacing, These de Doctorat, 6 avril 2012
 
13 Huang K., Fault modeling and diagnosis for nanometric mixed-signal/RF circuits, These de Doctorat, 16 novembre 2011
 
14 Akkouche N., Optimisation of the production test of analog and RF circuit using statistical modeling techniques, These de Doctorat, 9 septembre 2011
 
15 Khereddine R., Adaptive logical control and test of AMS/RF circuits, These de Doctorat, 7 septembre 2011
 
16 Arthaud Y., Design of a monitoring MEMS sensor for middle ear surgery, These de Doctorat, 19 juillet 2011
 
17 Dubois M., Methodology for test metrics estimation - Application to a new BIST for sigma-delta converters, These de Doctorat, 23 juin 2011
 
18 Tounsi F., MEMS Electrodynamic Microphone in CMOS technology: design, modeling and realization, These de Doctorat, 22 mars 2010
 
19 Asquini A., A BIST technique for RF frequency synthesizers, These de Doctorat, 22 janvier 2010
 
20 Tongbong J., Design and evaluation of a bist technique for RF LNA, These de Doctorat, 7 décembre 2009
 
21 Nguyen H.N., Alternative test technique for RF MEMS switch, These de Doctorat, 6 juillet 2009
 
22 Lizarraga L., BIST technique for CMOS imagers, These de Doctorat, 27 novembre 2008
 
23 Rufer L., ELECTROACOUSTIC AND ULTRASOUND TRANSDUCERS: FROM MACRO- TO MICRO-SYSTEMS, HDR, 16 novembre 2007
 
24 Bounceur A., CAT platform for mixed signal testing, These de Doctorat, 13 avril 2007
 
25 Rolindez L., A BIST technique for Sigma-Delta ADCs, These de Doctorat, 23 février 2007
 
26 Dhayni A., Pseudorandom Built-In Self-Test for microsystems, These de Doctorat, 14 novembre 2006
 
27 Prenat G., Design of a programmable analog and mixed-signal BIST architecture in deep submicron technology, These de Doctorat, 18 novembre 2005
 
28 Simeu E., Off-Line and On-Line BIST for Embedded Systems, HDR, 22 septembre 2005
 
29 Mir S., Design and Integrated Test of Analogue, Mixed-Signal and Microsystems Devices, HDR, 18 mai 2005
 
30 Domingues C., Design of micromachined acoustic transducers, These de Doctorat, 29 avril 2005
 
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