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49 résultats

  10 Revues internationales
   3 Conférences invitées
  28 Conférences internationales
   1 Livres & Ouvrages
   3 Autres communications
   1 Rapports
   3 Thèses

10 Revues internationales

 1 Clemente J.A., Hubert G., Franco F., Villa F., Baylac M., Mecha H., Puchner H., Velazco R., Sensitivity Characterization of a COTS 90-nm SRAM at Ultra Low Bias Voltage, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. PP, No. 99, DOI: 10.1109/TNS.2017.2682984, mars 2017
 
 2 Coelho A., Laurent R., Solinas M., Fraire J., Mazer E., Zergainoh N.-E., Velazco R., On the Robustness of Stochastic Bayesian Machines, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. PP, No. 99, DOI: 10.1109/TNS.2017.2678204, mars 2017
 
 3 Vargas F., Ramos P., Ray V., Jalier C., Stevens R., Dupont De Dinechin B., Baylac M., Villa F., Rey S., Zergainoh N.-E., Velazco R., Radiation Experiments on a 28nm Single-Chip Many-core Processor and SEU error-rate prediction, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 64, No. 1, pp. 483-490, DOI: 10.1109/TNS.2016.2638081, janvier 2017
 
 4 Souari A., Thibeault Cl., Blaquière Y., Velazco R., Towards an efficient SEU effects emulation on SRAM-based FPGAs, Microelectronics Reliability, Ed. Elsevier, Vol. 66, pp. 173-182, novembre 2016
 
 5 Ramos P., Vargas V., Clemente J.A., Zergainoh N.-E., Mehaut J-F., Velazco R., Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2193 - 2200, DOI: 10.1109/TNS.2016.2537643, juillet 2016
 
 6 Clemente J.A., Franco F., Villa F., Baylac M., Rey S., Mecha H., Agapito J.-A., Puchner H., Hubert G., Velazco R., Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2087–2094, DOI: 10.1109/TNS.2016.2551263, avril 2016
 
 7 Clemente J.A., Franco F., Villa F., Baylac M., Ramos P., Vargas V., Mecha H., Agapito J.-A., Velazco R., Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2072 - 2079, DOI: 10.1109/TNS.2016.2522819, avril 2016
 
 8 Clemente J.A., Mansour W., Ayoubi R., Serrano F., Mecha H., Ziade H., El Falou W., Velazco R., Hardware implementation of a fault-tolerant Hopfield Neural Network on FPGAs, Neurocomputing Journal, Ed. Elsevier, Vol. 171, No. 1, pp. 1606-1609, DOI: 10.1016/j.neucom.2015.06.038, janvier 2016
 
 9 Papavramidou P., Nicolaidis M., Test Algorithms for ECC-based Memory Repair in Ultimate CMOS and Post-CMOS, IEEE Transactions on Computers, Ed. IEEE, Vol. 99, No. PP, pp. 1, DOI: 10.1109/TC.2015.2479618, septembre 2015
 
10 Nicolaidis M., Double-Sampling Design Paradigm - a Compendium of Architectures, IEEE Transactions on Device and Materials Reliability, Vol. 15, No. 1, pp. 10-23, DOI: 10.1109/TDMR.2014.2388358, mars 2015
 
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3 Conférences invitées

1 Velazco R., Error-rate prediction for programmable circuits: methodology, tools and studied cases, Invited Talk, 2nd Aerospace Bolivian Conference (ABC’16), La Paz, BOLIVIA, 27 au 29 juillet 2016
 
2 Velazco R., Error rate prediction for programmable circuits: methodology, tools and studied cases, Workshop on the Effects of Ionizing Radiation on Electronic and Photonic Components for Aerospacial applications (WERICE'15), São José dos Campos, BRAZIL, 3 au 5 novembre 2015
 
3 Velazco R., Effects of radiation in digital integrated circuits: origins, mitigation technics and experimental tests, IEEE WESCIS (Education Society and Computer Intelligence Society), Tucuman, ARGENTINA, 2 octobre 2015
 
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28 Conférences internationales

 1 Charif A., Zergainoh N.-E., Coelho A., Nicolaidis M., Rout3D: A Lightweight Adaptive Routing Algorithm for Tolerating Faulty Vertical Links in 3D-NoCs, 22th IEEE European Test Symposium (ETS'17), pp. 1-6, Limassol, CYPRUS, 22 au 26 mai 2017
 
 2 Fraire J., Feldmann M., Burleigh S., Benefits and Challenges of Cross-Linked Ring Road Satellite Networks: A Case Study, IEEE International Conference on Communications (ICC'17), Paris, FRANCE, 1 mai 2017
 
 3 Solinas M., Coelho A., Fraire J., Zergainoh N.-E., Velazco R., TGV: Tester Generic and Versatile for Radiation Effects on Advanced VLSI Circuits, IEEE/ACM Design, Automation, and Test in Europe (DATE'17), Univ. Booth, Lausanne, SWITZERLAND, 27 au 31 mars 2017
 
 4 Charif A., Zergainoh N.-E., Nicolaidis M., GNOCS: an ultra-fast, highly extensible, cycle-accurate GPU-Based parallel Network-on-Chip simulator, Design, Automation & Test in Europe Conference, Univ.Booth (DATE'17), Lausanne, SWITZERLAND, 23 au 31 mars 2017
 
 5 Charif A., Coelho A., Zergainoh N.-E., Nicolaidis M., MINI-ESPADA: A Low-Cost Fully Adaptive Routing Mechanism for Networks-on-Chips, IEEE Latin-American Test Symposium (LATS'17), pp. 1-4, Bogota, COLOMBIA, 13 au 15 mars 2017
 
 6 Bonnoit T., Coelho A., Zergainoh N.-E., Velazco R., SEU Impact in Processor's Control-Unit: Preliminary Results Obtained for LEON3 Soft-Core, 18th IEEE Latin American Test Symposium (LATS’17), pp. 1-4, Bogota, COLOMBIA, 13 au 15 mars 2017
 
 7 Barrientos J., Ferral A., Cara L., Fraire J., Velazco R., Madoery P., Ferreyra P., A Segmented Architecture Approach to Provide a Continuous, Long-Term, Adaptive and Cost-effective Glaciers Monitoring System Based on DTN Communications and Cubesat Platforms, 1st IAA Latin American Symposium on Small Satellites: Advanced Technologies and Distributed Systems, Buenos Aires, ARGENTINA, 7 au 10 mars 2017
 
 8 Ferreyra P., Fraire J., Gomez F., Barrientos J., Velazco R., Enhancing Contact Graph Routing Forwarding Performance for Segmented Satellites Architectures, 1st IAA Latin American Symposium on Small Satellites: Advanced Technologies and Distributed Systems, San Martin Buenos Aires, ARGENTINA, 7 au 10 mars 2017
 
 9 Solinas M., Coelho A., Fraire J., Zergainoh N.-E., Ferreyra P., Velazco R., Preliminary Results of NETFI-2: An Automatic Method for Fault Injection on HDL-Based Designs, 18th IEEE Latin-American Test Symposium (LATS'17), Bogota, COLOMBIA, 1 mars 2017
 
10 Bonnoit T., Zergainoh N.-E., Nicolaidis M., Velazco R., Low Cost Rollback to Improve Fault-Tolerance in VLSI Circuits, IEEE International Symposium on Circuits and Systems (LASCAS'17), pp. 1-4, Bariloche, ARGENTINA, 20 au 23 février 2017
 
11 Charif A., Coelho A., Zergainoh N.-E., Nicolaidis M., Detailed and highly parallelizable cycle-accurate network-on-chip simulation on GPGPU, ACM/IEEE Design Automation Conference (ASPDAC'17), pp. 672-677, Chiba/Tokyo, JAPAN, DOI: 10.1109/ASPDAC.2017.7858401, 16 au 19 janvier 2017
 
12 Solinas M., Fraire J., Coderch N., Ferrer A., Velazco R., Primeros Resultados con NETFI-2: Una Nueva Herramienta para la Inyección de Fallos en Diseños Basados en HDL, VII Congreso de Microelectrónica Aplicada, San Luis, ARGENTINA, 26 au 28 octobre 2016
 
13 Charif A., Zergainoh N.-E., Nicolaidis M., A New Approach to Deadlock-Free Fully Adaptive Routing for High-Performance Fault-Tolerant NoCs, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT'16), Connecticut, UNITED STATES, 19 au 21 septembre 2016
 
14 Clemente J.A., Hubert G., Franco F., Villa F., Baylac M., Mecha H., Velazco R., Evaluation of the Sensitive of a COTS 90-nm Memory at Low Bias Voltage, Radiation and its Effects on Components and Systems (RADECS'16)), Bremen, GERMANY, 19 au 23 septembre 2016
 
15 Coelho A., Solinas M., Laurent R., Fraire J., Mazer E., Zergainoh N.-E., Karaoui S., Velazco R., Evidences of Stochastic Bayesian Machines Robustness Against SEUs and SETs, IEEE European Conference on Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 19 au 23 septembre 2016
 
16 Franco F., Clemente J.A., Baylac M., Rey S., Villa F., Mecha H., Agapito J.-A., Puchner H., Hubert G., Velazco R., Some Properties of only-SBUs Scenarios in SRAMs Applied to the Detection of MCUs, Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 19 au 23 septembre 2016
 
17 Coelho A., Laurent R., Mazer E., Zergainoh N.-E., Fraire J., Solinas M., Karaoui S., Velazco R., Evidences of Bayesian Machines Robustness Against SEUs and SETs, Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 1 septembre 2016
 
18 Fraire J., Madoery P., Finochietto J., Ferreyra R., Velazco R., Internetworking Approaches Towards Along-Track Segmented Satellite Architectures, IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE'16), Aachen, GERMANY, 1 au 9 septembre 2016
 
19 Charif A., Zergainoh N.-E., Nicolaidis M., Addressing transient routing errors in fault-tolerant Networks-on-Chips, 21th IEEE European Test Symposium (ETS'06)), Amsterdam, NETHERLANDS, 23 au 27 mai 2016
 
20 Souari A., Thibeault Cl., Blaquière Y., Velazco R., An Automated Fault Injection for Evaluation of LUTs Robustness in SRAM-Based FPGAs, IEEE East-West Design & Test Symposium (EWDTS’15), Batumi, GEORGIA, 26 au 29 septembre 2015
 
21 Clemente J.A., Franco F., Villa F., Baylac M., Ramos P., Vargas V., Mecha H., Agapito J.-A., Velazco R., Neutron-Induced Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage, Radiation and its Effects on Components and Systems (RADECS’15), pp. 1-4, Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365640 , 14 au 18 septembre 2015
 
22 Ramos P., Vargas V., Baylac M., Villa F., Rey S., Clemente J.A., Zergainoh N.-E., Velazco R., Sensitivity to Neutron Radiation of a 45 nm SOI Multi-Core Processor, Radiation and Its Effects on Components and Systems (RADECS’15), Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365665 , 14 au 18 septembre 2015
 
23 Clemente J.A., Franco F., Villa F., Baylac M., Rey S., Mecha H., Agapito J.-A., Puchner H., Hubert G., Velazco R., Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs, Radiation and its Effects on Components and Systems (RADECS’15), pp. 1-4, Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365670, 14 au 18 septembre 2015
 
24 Papavramidou P., Nicolaidis M., Low-power memory repair for high defect densities, 21st IEEE International On-Line Testing Symposium (IOLTS'15), pp. 171-173, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229853, 6 au 8 juillet 2015
 
25 Charif A., Zergainoh N.-E., Nicolaidis M., MUGEN: A High-Performance Fault-Tolerant Routing Algorithm for Unreliable Networks-on- Chip, 21st IEEE International On-Line Testing Symposium (IOLTS'15), pp. 71-76, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229835, 6 au 8 juillet 2015
 
26 Souari A., Thibeault Cl., Blaquière Y., Velazco R., Optimization of SEU emulation on SRAM FPGAs based on sensitiveness analysis, 21st International On-Line Testing Symposium (IOLTS'15), pp. 36-39, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229827, 6 au 8 juillet 2015
 
27 Nicolaidis M., Papavramidou P., Memory repair for high defect densities, 33rd IEEE VLSI Test Symposium (VTS'15), pp. 1-4, Napa Valley, California, UNITED STATES, DOI: 10.1109/VTS.2015.7116277, 27 au 29 avril 2015
 
28 Vargas V., Ramos P., Velazco R., Mehaut J-F., Zergainoh N.-E., Evaluating SEU fault-injection on parallel applications implemented on multicore processors, IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS'15), pp. 1-4, Montevideo, URUGUAY, DOI: 10.1109/LASCAS.2015.7250449, 25 au 27 février 2015
 
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1 Livres & Ouvrages

1 Nicolaidis M. (Eds.) Design for Reliability and Yield for Ultimate CMOS Technologies, IEEE Transactions on Device and Materials Reliability, Ed. IEEE, 2015
 
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3 Autres communications

1 Velazco R., Estudio de la robustez frente a SEUs de algoritmos auto-convergentes, Conferencias de Investigación para Posgrado, Facultad de Informatics, Universidad Complutense, Madrid, SPAIN, 2015
 
2 Velazco R., Robustness of intelligent control with respect to radiation induced faults. Estudio de la robustez del "control inteligente" frente a fallos inducidos por las radiaciones, Seminaire in the frame of “Post-graduate Research Conferences”, Conferencias de Investigación para Posgrado, Facultad de Informatics, Universidad Complutense, Madrid, SPAIN, 2015
 
3 Velazco R., Efectos de radiaciones en circuitos integrados digitales: orígenes, técnicas de mitigación y test experimentales, Reunión de trabajo en Procesamiento de la Información y Control (RPIC'15), Córdoba, ARGENTINA, 2015
 
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1 Rapports

1 Papavramidou P., Nicolaidis M., Test Algorithms for ECC-based Memory Repair in Ultimate CMOS and Post-CMOS, ISRN: TIMA-RR--2015/01--FR, 9 avril 2015
 
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3 Thèses

1 Vargas V., Software approach to improve the reliability of parallel applications implemented on multi-core and many-core processors, These de Doctorat, 28 avril 2017
 
2 Ramos P., Evaluation of the SEE sensitivity and methodology for error rate prediction of applications implemented in Multi-core and Many-core processors, These de Doctorat, 18 avril 2017
 
3 Costenaro E., Techniques for the evaluation and the improvement of emergent technologies’ behaviour facing random errors, These de Doctorat, 9 décembre 2015
 
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