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32 résultats

   7 Revues internationales
   2 Conférences invitées
  17 Conférences internationales
   1 Livres & Ouvrages
   3 Autres communications
   1 Rapports
   1 Thèses

7 Revues internationales

1 Vargas F., Ramos P., Zergainoh N.-E., Mehaut J-F., Velazco R., Ray V., Baylac M., Radiation Experiments on a 28nm Single-Chip Many-core Processor and SEU error-rate prediction, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 99, DOI: 10.1109/TNS.2016.2638081, décembre 2016
 
2 Ramos P., Vargas V., Clemente J.A., Zergainoh N.-E., Mehaut J-F., Velazco R., Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2193 - 2200, DOI: 10.1109/TNS.2016.2537643, juillet 2016
 
3 Clemente J.A., Franco F., Villa F., Baylac M., Ramos P., Vargas V., Mecha H., Agapito J.-A., Velazco R., Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2072 - 2079, DOI: 10.1109/TNS.2016.2522819, avril 2016
 
4 Clemente J.A., Mansour W., Ayoubi R., Serrano F., Mecha H., Ziade H., El Falou W., Velazco R., Hardware implementation of a fault-tolerant Hopfield Neural Network on FPGAs, Neurocomputing Journal, Ed. Elsevier, Vol. 171, No. 1, pp. 1606-1609, DOI: 10.1016/j.neucom.2015.06.038, janvier 2016
 
5 Papavramidou P., Nicolaidis M., Test Algorithms for ECC-based Memory Repair in Ultimate CMOS and Post-CMOS, IEEE Transactions on Computers, Ed. IEEE, Vol. 99, No. PP, pp. 1, DOI: 10.1109/TC.2015.2479618, septembre 2015
 
6 Nicolaidis M., Double-Sampling Design Paradigm - a Compendium of Architectures, IEEE Transactions on Device and Materials Reliability, Vol. 15, No. 1, pp. 10-23, DOI: 10.1109/TDMR.2014.2388358, mars 2015
 
7 Zergainoh N.-E., Sorel Y., An Architecture for an efficient multiprocessor development environment: the fast distributed executive for reactive system, Journal of Systems Architecture (JSA), Ed. Elsevier, Vol. , décembre 1995
 
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2 Conférences invitées

1 Velazco R., Error rate prediction for programmable circuits: methodology, tools and studied cases, Workshop on the Effects of Ionizing Radiation on Electronic and Photonic Components for Aerospacial applications (WERICE'15), São José dos Campos, BRAZIL, 3 au 5 novembre 2015
 
2 Velazco R., Effects of radiation in digital integrated circuits: origins, mitigation technics and experimental tests, IEEE WESCIS (Education Society and Computer Intelligence Society), Tucuman, ARGENTINA, 2 octobre 2015
 
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17 Conférences internationales

 1 Fraire J., Feldmann M., Burleigh S., Benefits and Challenges of Cross-Linked Ring Road Satellite Networks: A Case Study, IEEE International Conference on Communications (ICC'17), Paris, FRANCE, 1 mai 2017
 
 2 Solinas M., Coelho A., Fraire J., Zergainoh N.-E., Ferreyra P., Velazco R., Preliminary Results of NETFI-2: An Automatic Method for Fault Injection on HDL-Based Designs, 18th IEEE Latin-American Test Symposium (LATS'17), Bogota, COLOMBIA, 1 mars 2017
 
 3 Charif A., Zergainoh N.-E., Nicolaidis M., A New Approach to Deadlock-Free Fully Adaptive Routing for High-Performance Fault-Tolerant NoCs, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT'16), Connecticut, UNITED STATES, 19 au 21 septembre 2016
 
 4 Coelho A., Solinas M., Laurent R., Fraire J., Mazer E., Zergainoh N.-E., Karaoui S., Velazco R., Evidences of Stochastic Bayesian Machines Robustness Against SEUs and SETs, IEEE European Conference on Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 19 au 23 septembre 2016
 
 5 Coelho A., Laurent R., Mazer E., Zergainoh N.-E., Fraire J., Solinas M., Karaoui S., Velazco R., Evidences of Bayesian Machines Robustness Against SEUs and SETs, Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 1 septembre 2016
 
 6 Fraire J., Madoery P., Finochietto J., Ferreyra R., Velazco R., Internetworking Approaches Towards Along-Track Segmented Satellite Architectures, IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE'16), Aachen, GERMANY, 1 au 9 septembre 2016
 
 7 Charif A., Zergainoh N.-E., Nicolaidis M., Addressing transient routing errors in fault-tolerant Networks-on-Chips, 21th IEEE European Test Symposium (ETS'06)), Amsterdam, NETHERLANDS, 23 au 27 mai 2016
 
 8 Souari A., Thibeault Cl., Blaquière Y., Velazco R., An Automated Fault Injection for Evaluation of LUTs Robustness in SRAM-Based FPGAs, IEEE East-West Design & Test Symposium (EWDTS’15), Batumi, GEORGIA, 26 au 29 septembre 2015
 
 9 Clemente J.A., Franco F., Villa F., Baylac M., Ramos P., Vargas V., Mecha H., Agapito J.-A., Velazco R., Neutron-Induced Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage, Radiation and its Effects on Components and Systems (RADECS’15), pp. 1-4, Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365640 , 14 au 18 septembre 2015
 
10 Ramos P., Vargas V., Baylac M., Villa F., Rey S., Clemente J.A., Zergainoh N.-E., Velazco R., Sensitivity to Neutron Radiation of a 45 nm SOI Multi-Core Processor, Radiation and Its Effects on Components and Systems (RADECS’15), Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365665 , 14 au 18 septembre 2015
 
11 Clemente J.A., Franco F., Villa F., Baylac M., Rey S., Mecha H., Agapito J.-A., Puchner H., Hubert G., Velazco R., Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs, Radiation and its Effects on Components and Systems (RADECS’15), pp. 1-4, Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365670, 14 au 18 septembre 2015
 
12 Papavramidou P., Nicolaidis M., Low-power memory repair for high defect densities, 21st IEEE International On-Line Testing Symposium (IOLTS'15), pp. 171-173, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229853, 6 au 8 juillet 2015
 
13 Charif A., Zergainoh N.-E., Nicolaidis M., MUGEN: A High-Performance Fault-Tolerant Routing Algorithm for Unreliable Networks-on- Chip, 21st IEEE International On-Line Testing Symposium (IOLTS'15), pp. 71-76, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229835, 6 au 8 juillet 2015
 
14 Souari A., Thibeault Cl., Blaquière Y., Velazco R., Optimization of SEU emulation on SRAM FPGAs based on sensitiveness analysis, 21st International On-Line Testing Symposium (IOLTS'15), pp. 36-39, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229827, 6 au 8 juillet 2015
 
15 Nicolaidis M., Papavramidou P., Memory repair for high defect densities, 33rd IEEE VLSI Test Symposium (VTS'15), pp. 1-4, Napa Valley, California, UNITED STATES, DOI: 10.1109/VTS.2015.7116277, 27 au 29 avril 2015
 
16 Vargas V., Ramos P., Velazco R., Mehaut J-F., Zergainoh N.-E., Evaluating SEU fault-injection on parallel applications implemented on multicore processors, IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS'15), pp. 1-4, Montevideo, URUGUAY, DOI: 10.1109/LASCAS.2015.7250449, 25 au 27 février 2015
 
17 Nicolaidis M., Oliveira Duarte R., Design of fault-secure parity-prediction Booth multipliers, Design, Automation and Test in Europe (DATE'98), pp. 7-14, Paris, FRANCE, DOI: 10.1109/DATE.1998.655830, 23 au 26 février 1998
 
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1 Livres & Ouvrages

1 Nicolaidis M. (Eds.) Design for Reliability and Yield for Ultimate CMOS Technologies, IEEE Transactions on Device and Materials Reliability, Ed. IEEE, 2015
 
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3 Autres communications

1 Velazco R., Estudio de la robustez frente a SEUs de algoritmos auto-convergentes, Conferencias de Investigación para Posgrado, Facultad de Informatics, Universidad Complutense, Madrid, SPAIN, 2015
 
2 Velazco R., Robustness of intelligent control with respect to radiation induced faults. Estudio de la robustez del "control inteligente" frente a fallos inducidos por las radiaciones, Seminaire in the frame of “Post-graduate Research Conferences”, Conferencias de Investigación para Posgrado, Facultad de Informatics, Universidad Complutense, Madrid, SPAIN, 2015
 
3 Velazco R., Efectos de radiaciones en circuitos integrados digitales: orígenes, técnicas de mitigación y test experimentales, Reunión de trabajo en Procesamiento de la Información y Control (RPIC'15), Córdoba, ARGENTINA, 2015
 
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1 Rapports

1 Papavramidou P., Nicolaidis M., Test Algorithms for ECC-based Memory Repair in Ultimate CMOS and Post-CMOS, ISRN: TIMA-RR--2015/01--FR, 9 avril 2015
 
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1 Thèses

1 Costenaro E., Techniques for the evaluation and the improvement of emergent technologies’ behaviour facing random errors, These de Doctorat, 9 décembre 2015
 
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