South European Test Seminar 2017 (SETS'17)

Venue: Alpe d'Huez, FRANCE
Date: March 20-24, 2017

Steering Committee : ANGHEL L.
Program Committee : ANGHEL L.
Local Organization : ITIE Anne-Laure

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18th IEEE Latin American Test Symposium (LATS'17)

Venue: Bogota, COLOMBIA
Date: March 13-15, 2017

General Chair : VELAZCO R.
Panel Chair : ZERGAINOH N. - E.
Special Session Chair : SIMEU E.

Summary: The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 18th LATS will be invited to re-submit to IEEE Design and Test of Computers, Journal of Electronic Testing: Theory and Applications - JETTA (Springer), Journal of Low Power Electronics - JOLPE (American Scientific Publishers), and IEEE Transactions on Computer-Aided Design (TCAD).

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4th Workshop on Cryptography and Security in Computing Systems (CS2'17)

Venue: Stockholm, SWEDEN
Date: January 24, 2017

Program Committee : MAISTRI P.

The 11th International Design & Test Symposium (IDT'16)

Venue: Hammamet, TUNISIA
Date: December 19, 2016

Program Committee : ANGHEL L.
Program Co-chair : MIR S.

The 16th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (POWERMEMS'16)

Venue: Paris, FRANCE
Date: December 6-9, 2016

General Chair : BASROUR S.

14th ACM-IEEE International Conference on Formal Methods and Models for System Design Indian Institute of Technology (MEMOCODE'16)

Venue: Kanpur, INDIA
Date: November 18-20, 2016

Program Committee : MORIN-ALLORY K.

International Test Conference (ITC'16)

Venue: Fort Worth (TX), USA
Date: November 15-17, 2016

Program Committee : ANGHEL L.

12th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA'16)

Venue: Montreal, CANADA
Date: November 7-10, 2016

General Chair : VELAZCO R.

IEEE Sensors

IEEE Sensors
Venue: Orlando (FL), USA
Date: Oct 30th - Nov 2nd, 2016

Technical Program Committee : RUFER L.