Coopération

Conférences


South European Test Seminar 2017 (SETS'2017)

SETS
Venue: Alpe d'Huez, FRANCE
Date: March 20-24, 2017

Steering Committee : ANGHEL L.
Program Committee : ANGHEL L.
Local Organization : ITIE Anne-Laure

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18th IEEE Latin American Test Symposium (LATS'2017)

LATS
Venue: Bogota, COLOMBIA
Date: March 13-15, 2017

General Chair : VELAZCO R.
Panel Chair : ZERGAINOH N. - E.
Special Session Chair : SIMEU E.

Summary: The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 18th LATS will be invited to re-submit to IEEE Design and Test of Computers, Journal of Electronic Testing: Theory and Applications - JETTA (Springer), Journal of Low Power Electronics - JOLPE (American Scientific Publishers), and IEEE Transactions on Computer-Aided Design (TCAD).

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The 11th International Design & Test Symposium (IDT'2016)

IDT
Venue: Hammamet, TUNISIA
Date: December 19, 2016

Program Committee : ANGHEL L.
Program Co-chair : MIR S.

International Test Conference (ITC'2016)

ITC
Venue: Fort Worth (TX), USA
Date: November 15-17, 2016

Program Committee : ANGHEL L.

12th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA'2016)

SERESSA
Venue: Montreal, CANADA
Date: November 7-10, 2016

General Chair : VELAZCO R.

IEEE Sensors

IEEE Sensors
Venue: Orlando (FL), USA
Date: Oct 30th - Nov 2nd, 2016

Technical Program Committee : RUFER L.

IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'2016)

VLSI-SoC
Venue: Tallinn, ESTONIA
Date: September 26-28, 2016

Technical Program Committee : PIERRE L.
Steering Committee Chair : MIR S.

IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFT'2016)

DFT
Venue: Storrs (CT), USA
Date: September 19-20, 2016

Program Committee : ANGHEL L.

Forum on specification & Design Languages (FDL'2016)

FDL
Venue: Bremen, GERMANY
Date: September 14-16, 2016

Program Committee : BORRIONE D., PIERRE L.