18th IEEE Latin American Test Symposium

Venue: Bogota, COLOMBIA
Date: 13th - 15th March 2017

General Chair : VELAZCO R.
Panel Chair : ZERGAINOH N. - E.
Special Session Chair : SIMEU E.

Summary: The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 18th LATS will be invited to re-submit to IEEE Design and Test of Computers, Journal of Electronic Testing: Theory and Applications - JETTA (Springer), Journal of Low Power Electronics - JOLPE (American Scientific Publishers), and IEEE Transactions on Computer-Aided Design (TCAD).

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South European Test Seminar 2017

Venue: Alpe d'Huez, France, FRANCE
Date: 20 au 24 March 2017

Local Organization : ITIE Anne-Laure
Program Committee : ANGHEL L.
Steering Committee : ANGHEL L.

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