Coopération
Conférences
11th IEEE Latin-American Test Workshop
LATW
Venue: Punta del Este, URUGUAY
Date: 28-31 March 2010
General chair: R. VELAZCO
Summary: The Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board and component testing and fault-tolerance with design, manufacturing and field considerations in mind.
16th IEEE Internl On-Line Testing Symposium
IOLTS
Venue: Corfu Island, GREECE
Date: 5-7 july 2010
General chair: M. NICOLAIDIS
Summary: Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.
